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Design of the Beam Diagnostic System for the New 3GeV Light Source in Japan
https://repo.qst.go.jp/records/80537
https://repo.qst.go.jp/records/8053731d91221-ddfa-496d-a9f5-46a6734b0257
| Item type | 会議発表用資料 / Presentation(1) | |||||
|---|---|---|---|---|---|---|
| 公開日 | 2020-09-01 | |||||
| タイトル | ||||||
| タイトル | Design of the Beam Diagnostic System for the New 3GeV Light Source in Japan | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_c94f | |||||
| 資源タイプ | conference object | |||||
| アクセス権 | ||||||
| アクセス権 | metadata only access | |||||
| アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
| 著者 |
前坂, 比呂和
× 前坂, 比呂和× 福井, 達× 出羽, 秀樹× 藤田, 貴弘× 正木, 満博× 高野, 史郎× 上島, 考太× Fujita, Takahiro× Masaki, Mitsuhiro× Takano, Shiro× Ueshima, Kouta |
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| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | We present a design overview of the beam diagnostic system for the new 3 GeV light source being constructed in Tohoku, Japan, and some test results obtained at SPring-8. This light source will generate brilliant x-rays from a high-quality electron beam having 1 nm rad emittance and 400 mA maximum stored current. To achieve the design performance and stability, we must monitor various beam parameters precisely. The beam position should be detected precisely: single-pass resolution < 0.1 mm (0.1 nC injected beam), COD resolution < 0.1 μm (more than 100 mA stored current), position stability < 5 μm for 1 month. We will use 112 button-type BPMs in the storage ring for these purposes. The stored beam current and beam size are also monitored with a DCCT and an x-ray pinhole camera. We will install a 3-pole wiggler to a straight section for the pinhole camera and other optical diagnostics. A stripline BPM and a stripline kicker will be installed to another straight section to suppress the beam instability and to measure betatron tune. We will use FPGA-based high-speed electronics for instability suppression with a bunch-by-bunch feedback method and real-time tune monitoring. | |||||
| 会議概要（会議名, 開催地, 会期, 主催者等） | ||||||
| 内容記述タイプ | Other | |||||
| 内容記述 | IBIC 2020 - 9th International Beam Instrumentation Conference | |||||
| 発表年月日 | ||||||
| 日付 | 2020-09-16 | |||||
| 日付タイプ | Issued | |||||
