@misc{oai:repo.qst.go.jp:00080537,
 author = {前坂, 比呂和 and 福井, 達 and 出羽, 秀樹 and 藤田, 貴弘 and 正木, 満博 and 高野, 史郎 and 上島, 考太 and Fujita, Takahiro and Masaki, Mitsuhiro and Takano, Shiro and Ueshima, Kouta},
 month = {Sep},
 note = {We present a design overview of the beam diagnostic system for the new 3 GeV light source being constructed in Tohoku, Japan, and some test results obtained at SPring-8. This light source will generate brilliant x-rays from a high-quality electron beam having 1 nm rad emittance and 400 mA maximum stored current. To achieve the design performance and stability, we must monitor various beam parameters precisely. The beam position should be detected precisely: single-pass resolution < 0.1 mm (0.1 nC injected beam), COD resolution   < 0.1 μm (more than 100 mA stored current), position stability < 5 μm for 1 month. We will use 112 button-type BPMs in the storage ring for these purposes. The stored beam current and beam size are also monitored with a DCCT and an x-ray pinhole camera. We will install a 3-pole wiggler to a straight section for the pinhole camera and other optical diagnostics. A stripline BPM and a stripline kicker will be installed to another straight section to suppress the beam instability and to measure betatron tune. We will use FPGA-based high-speed electronics for instability suppression with a bunch-by-bunch feedback method and real-time tune monitoring., IBIC 2020 - 9th International Beam Instrumentation Conference},
 title = {Design of the Beam Diagnostic System for the New 3GeV Light Source in Japan},
 year = {2020}
}