{"created":"2023-05-15T14:59:21.767185+00:00","id":80537,"links":{},"metadata":{"_buckets":{"deposit":"f0773e67-f19e-48a1-b49c-12fd494a213a"},"_deposit":{"created_by":1,"id":"80537","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"80537"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00080537","sets":["10:28"]},"author_link":["889536","889530","889540","889535","889532","889534","889531","889539","889538","889533","889537"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2020-09-16","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"We present a design overview of the beam diagnostic system for the new 3 GeV light source being constructed in Tohoku, Japan, and some test results obtained at SPring-8. This light source will generate brilliant x-rays from a high-quality electron beam having 1 nm rad emittance and 400 mA maximum stored current. To achieve the design performance and stability, we must monitor various beam parameters precisely. The beam position should be detected precisely: single-pass resolution < 0.1 mm (0.1 nC injected beam), COD resolution   < 0.1 μm (more than 100 mA stored current), position stability < 5 μm for 1 month. We will use 112 button-type BPMs in the storage ring for these purposes. The stored beam current and beam size are also monitored with a DCCT and an x-ray pinhole camera. We will install a 3-pole wiggler to a straight section for the pinhole camera and other optical diagnostics. A stripline BPM and a stripline kicker will be installed to another straight section to suppress the beam instability and to measure betatron tune. We will use FPGA-based high-speed electronics for instability suppression with a bunch-by-bunch feedback method and real-time tune monitoring.","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"IBIC 2020 - 9th International Beam Instrumentation Conference","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"前坂, 比呂和"}],"nameIdentifiers":[{"nameIdentifier":"889530","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"福井, 達"}],"nameIdentifiers":[{"nameIdentifier":"889531","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"出羽, 秀樹"}],"nameIdentifiers":[{"nameIdentifier":"889532","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"藤田, 貴弘"}],"nameIdentifiers":[{"nameIdentifier":"889533","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"正木, 満博"}],"nameIdentifiers":[{"nameIdentifier":"889534","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"高野, 史郎"}],"nameIdentifiers":[{"nameIdentifier":"889535","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"上島, 考太"}],"nameIdentifiers":[{"nameIdentifier":"889536","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Fujita, Takahiro","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"889537","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Masaki, Mitsuhiro","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"889538","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Takano, Shiro","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"889539","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ueshima, Kouta","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"889540","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"Design of the Beam Diagnostic System for the New 3GeV Light Source in Japan","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Design of the Beam Diagnostic System for the New 3GeV Light Source in Japan"}]},"item_type_id":"10005","owner":"1","path":["28"],"pubdate":{"attribute_name":"公開日","attribute_value":"2020-09-01"},"publish_date":"2020-09-01","publish_status":"0","recid":"80537","relation_version_is_last":true,"title":["Design of the Beam Diagnostic System for the New 3GeV Light Source in Japan"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T21:30:29.836344+00:00"}