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  1. 原著論文

Near Infrared Photoluminescence of NCVSi- Centers in High-Purity Semi-Insulating 4H-SiC Irradiated with Energetic Charged Particles

https://repo.qst.go.jp/records/80477
https://repo.qst.go.jp/records/80477
7873158f-cfeb-4387-b83d-d7c2ea8c2f1a
Item type 学術雑誌論文 / Journal Article(1)
公開日 2020-09-11
タイトル
タイトル Near Infrared Photoluminescence of NCVSi- Centers in High-Purity Semi-Insulating 4H-SiC Irradiated with Energetic Charged Particles
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_6501
資源タイプ journal article
アクセス権
アクセス権 metadata only access
アクセス権URI http://purl.org/coar/access_right/c_14cb
著者 Sato, Shinichiro

× Sato, Shinichiro

WEKO 907334

Sato, Shinichiro

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Narahara, Takuma

× Narahara, Takuma

WEKO 907335

Narahara, Takuma

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Onoda, Shinobu

× Onoda, Shinobu

WEKO 907336

Onoda, Shinobu

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Yamazaki, Yuichi

× Yamazaki, Yuichi

WEKO 907337

Yamazaki, Yuichi

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Hijikata, Yasuto

× Hijikata, Yasuto

WEKO 907338

Hijikata, Yasuto

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C. Gibson, Brant

× C. Gibson, Brant

WEKO 907339

C. Gibson, Brant

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D. Greentree, Andrew

× D. Greentree, Andrew

WEKO 907340

D. Greentree, Andrew

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Ohshima, Takeshi

× Ohshima, Takeshi

WEKO 907341

Ohshima, Takeshi

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Sato, Shinichiro

× Sato, Shinichiro

WEKO 907342

en Sato, Shinichiro

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Narahara, Takuma

× Narahara, Takuma

WEKO 907343

en Narahara, Takuma

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Onoda, Shinobu

× Onoda, Shinobu

WEKO 907344

en Onoda, Shinobu

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Yamazaki, Yuichi

× Yamazaki, Yuichi

WEKO 907345

en Yamazaki, Yuichi

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Ohshima, Takeshi

× Ohshima, Takeshi

WEKO 907346

en Ohshima, Takeshi

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抄録
内容記述タイプ Abstract
内容記述 This paper reports optical properties of negatively charged NcVsi- centers in silicon carbide (a nitrogen substituting for a carbon atom adjacent to a silicon vacancy) whose emission wavelength is 1100-1500 nm at room temperature. High-purity semi-insulating (HPSI) 4H-SiCs are implanted with high energy N ion beams and subsequently thermally annealed to form NcVsi- centers. We investigated a wide range of N ion implantation dose using a micro ion beam implantation technique and observed the photoluminescence intensity from the SiC-NV centers. We show that under conditions of heavy implantation, the excitation laser power excites residual defects and their fluorescences interferes with the emission from the NcVsi- centers. These results allow us to clarify
the requirements to optically detect isolated single NcVsi- centers at lightly implanted conditions.
書誌情報 Materials Science Forum

巻 1004, p. 355-360, 発行日 2020-07
出版者
出版者 Trans Tech Publications
ISSN
収録物識別子タイプ ISSN
収録物識別子 1662-9752
DOI
識別子タイプ DOI
関連識別子 10.4028/www.scientific.net/MSF.1004.355
関連サイト
識別子タイプ URI
関連識別子 https://www.scientific.net/MSF.1004.355
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