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Creation of nitrogen-vacancy centers in SiC by ion irradiation

https://repo.qst.go.jp/records/76311
https://repo.qst.go.jp/records/76311
6cd303d7-26f0-4c20-82f7-2755e6397777
Item type 会議発表用資料 / Presentation(1)
公開日 2019-07-20
タイトル
タイトル Creation of nitrogen-vacancy centers in SiC by ion irradiation
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_c94f
資源タイプ conference object
アクセス権
アクセス権 metadata only access
アクセス権URI http://purl.org/coar/access_right/c_14cb
著者 Ohshima, Takeshi

× Ohshima, Takeshi

WEKO 801862

Ohshima, Takeshi

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Sato, Shinichiro

× Sato, Shinichiro

WEKO 801863

Sato, Shinichiro

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Narahara, Takuma

× Narahara, Takuma

WEKO 801864

Narahara, Takuma

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Yamazaki, Yuichi

× Yamazaki, Yuichi

WEKO 801865

Yamazaki, Yuichi

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Abe, Yuta

× Abe, Yuta

WEKO 801866

Abe, Yuta

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Umeda, Takehide

× Umeda, Takehide

WEKO 801867

Umeda, Takehide

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Hijikata, Yasuto

× Hijikata, Yasuto

WEKO 801868

Hijikata, Yasuto

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Ohshima, Takeshi

× Ohshima, Takeshi

WEKO 801869

en Ohshima, Takeshi

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Sato, Shinichiro

× Sato, Shinichiro

WEKO 801870

en Sato, Shinichiro

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Yamazaki, Yuichi

× Yamazaki, Yuichi

WEKO 801871

en Yamazaki, Yuichi

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抄録
内容記述タイプ Abstract
内容記述 Color centers which act as stable single photon emitters (SPEs) in wide bandgap semiconductors are key elements for quantum technologies. Silicon carbide (SiC) is regarded as a promising host material for qubit/quantum sensor. It was reported that negatively charged nitrogen-vacancy (NcVsi-) center in SiC (S=1) act as SPS with its zero phonon line (ZPL) around 1170 ~1250 nm. However, detailed characteristics of NcVsi- center in SiC have not yet been clarified since the creation methods for NcVsi- have not yet been established.
In this study, various energetic charged particles such as protons, nitrogen (N), silicon (Si) and iodine (I) ions were irradiated into n-type and high purity semi-insulation (HPSI) hexagonal (4H) SiC and subsequently annealed up to 1100C. The creation of NcVsi in SiC are evaluated on the basis of photoluminescence (PL) characteristics.
会議概要(会議名, 開催地, 会期, 主催者等)
内容記述タイプ Other
内容記述 30th International Conference on Defects in Smiconductors (ICDS-30)
発表年月日
日付 2019-07-22
日付タイプ Issued
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