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Mo/Si Multilayer-Coated Photodiode Detector for Monitoring Soft X-Ray Laser Intensity

https://repo.qst.go.jp/records/54898
https://repo.qst.go.jp/records/54898
c46a04ef-95cc-41c7-8cee-55e7e7f9fc44
Item type 会議発表論文 / Conference Paper(1)
公開日 2018-05-08
タイトル
タイトル Mo/Si Multilayer-Coated Photodiode Detector for Monitoring Soft X-Ray Laser Intensity
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_5794
資源タイプ conference paper
アクセス権
アクセス権 metadata only access
アクセス権URI http://purl.org/coar/access_right/c_14cb
著者 今園, 孝志

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WEKO 561378

今園, 孝志

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今園 孝志

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WEKO 561379

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内容記述タイプ Abstract
内容記述 For the purpose of monitoring the intensity of laser-driven plasma soft X-ray laser (XRL) as well as providing an intense beam for XRL applications, the use of an X-ray photodiode detector coated with a Mo/Si multilayer mirror with high reflectance has been proposed and fabricated. The s-polarized reflectance of the multilayer-coated photodiode, MP, was measured to be 52.5% at an angle of incidence of 45° with synchrotron radiation at a wavelength of 13.9 nm. The transmittance of MP was 8.96%, which was defined as the ratio of the photodiode current measured at 45° to that at normal incidence. Moreover, with XRL pulses it is found that there is a strong correlation of 0.961 between the reflectance and transmittance of MP. These results indicate that the MP serves as a high reflectivity beam splitter with an X-ray detector enabling to be used for XRL applications.
書誌情報 Springer Proceedings in Physics

巻 202, p. 309-313, 発行日 2018-05
出版者
出版者 Springer International Publishing
ISSN
収録物識別子タイプ ISSN
収録物識別子 0930-8989
ISBN
識別子タイプ ISBN
関連識別子 978-3319-73024-0
DOI
識別子タイプ DOI
関連識別子 10.1007/978-3-319-73025-7_46
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