{"created":"2023-05-15T14:40:00.271722+00:00","id":54898,"links":{},"metadata":{"_buckets":{"deposit":"564daa4e-380a-4ba8-814a-fd3a094e0900"},"_deposit":{"created_by":1,"id":"54898","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"54898"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00054898","sets":["2"]},"author_link":["561379","561378"],"item_10003_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2018-05","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"313","bibliographicPageStart":"309","bibliographicVolumeNumber":"202","bibliographic_titles":[{"bibliographic_title":"Springer Proceedings in Physics"}]}]},"item_10003_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"For the purpose of monitoring the intensity of laser-driven plasma soft X-ray laser (XRL) as well as providing an intense beam for XRL applications, the use of an X-ray photodiode detector coated with a Mo/Si multilayer mirror with high reflectance has been proposed and fabricated. The s-polarized reflectance of the multilayer-coated photodiode, MP, was measured to be 52.5% at an angle of incidence of 45° with synchrotron radiation at a wavelength of 13.9 nm. The transmittance of MP was 8.96%, which was defined as the ratio of the photodiode current measured at 45° to that at normal incidence. Moreover, with XRL pulses it is found that there is a strong correlation of 0.961 between the reflectance and transmittance of MP. These results indicate that the MP serves as a high reflectivity beam splitter with an X-ray detector enabling to be used for XRL applications.","subitem_description_type":"Abstract"}]},"item_10003_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Springer International Publishing"}]},"item_10003_relation_10":{"attribute_name":"ISBN","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"978-3319-73024-0","subitem_relation_type_select":"ISBN"}}]},"item_10003_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1007/978-3-319-73025-7_46","subitem_relation_type_select":"DOI"}}]},"item_10003_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0930-8989","subitem_source_identifier_type":"ISSN"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"今園, 孝志"}],"nameIdentifiers":[{"nameIdentifier":"561378","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"今園 孝志","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"561379","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"Mo/Si Multilayer-Coated Photodiode Detector for Monitoring Soft X-Ray Laser Intensity","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Mo/Si Multilayer-Coated Photodiode Detector for Monitoring Soft X-Ray Laser Intensity"}]},"item_type_id":"10003","owner":"1","path":["2"],"pubdate":{"attribute_name":"公開日","attribute_value":"2018-05-08"},"publish_date":"2018-05-08","publish_status":"0","recid":"54898","relation_version_is_last":true,"title":["Mo/Si Multilayer-Coated Photodiode Detector for Monitoring Soft X-Ray Laser Intensity"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T22:55:31.192725+00:00"}