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  1. 原著論文

Aperiodic reflection diffraction gratings for soft X-ray radiation and their application

https://repo.qst.go.jp/records/49443
https://repo.qst.go.jp/records/49443
dc487340-94da-4445-8947-bf58614fd31f
Item type 学術雑誌論文 / Journal Article(1)
公開日 2018-12-19
タイトル
タイトル Aperiodic reflection diffraction gratings for soft X-ray radiation and their application
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_6501
資源タイプ journal article
アクセス権
アクセス権 metadata only access
アクセス権URI http://purl.org/coar/access_right/c_14cb
著者 A. Vishnyakov, E.

× A. Vishnyakov, E.

WEKO 734707

A. Vishnyakov, E.

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O. Kolesnikov, A.

× O. Kolesnikov, A.

WEKO 734708

O. Kolesnikov, A.

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ピロジコフ, アレキサンダー

× ピロジコフ, アレキサンダー

WEKO 734709

ピロジコフ, アレキサンダー

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N. Ragozin, E.

× N. Ragozin, E.

WEKO 734710

N. Ragozin, E.

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N. Shatokhin, A.

× N. Shatokhin, A.

WEKO 734711

N. Shatokhin, A.

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Pirozhkov, Alexander

× Pirozhkov, Alexander

WEKO 734712

en Pirozhkov, Alexander

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内容記述タイプ Abstract
内容記述 We briefly review the works concerned with the development and experimental use of the spectral instruments based on aperiodic reflection gratings whose spacing varies monotonically across the aperture according to a prescribed law (VLS gratings). The review considers the employment of VLS-grating instruments intended for the spectroscopy of laboratory and astrophysical plasmas, including the diagnostics of relativistic laser plasmas, for measuring X-ray laser linewidths, for recording the high-order harmonics of laser radiation, the radiation of fast electric discharges and other laboratory X-ray sources, as well as in reflectometry, X-ray fluorescence analysis and microscopy with the use of synchrotron radiation and laser-plasma radiation, and in emission spectroscopy combined with an electron microscope. Also discussed are achievements in the recently undertaken design and development of special-purpose VLS spectrometers intended for the investigation of the electronic structure of different materials and molecules by the spectroscopic technique of resonant inelastic X-ray scattering of synchrotron radiation. We describe flat-field grazing-incidence spectrometers with concave VLS gratings, which are compatible with modern CCD detectors, as well as plane VLS gratings, which are the key elements of scanning high- and ultrahigh-resolution spectrometers/monochromators with a constant deviation angle and stigmatic (imaging) spectrometers, which are also compatible with CCD detectors.
書誌情報 Quantum Electronics

巻 48, 号 10, p. 916-929, 発行日 2018-08
DOI
識別子タイプ DOI
関連識別子 10.1070/QEL16707
関連サイト
識別子タイプ URI
関連識別子 http://iopscience.iop.org/article/10.1070/QEL16707
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