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Aperiodic reflection diffraction gratings for soft X-ray radiation and their application
https://repo.qst.go.jp/records/49443
https://repo.qst.go.jp/records/49443dc487340-94da-4445-8947-bf58614fd31f
Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2018-12-19 | |||||
タイトル | ||||||
タイトル | Aperiodic reflection diffraction gratings for soft X-ray radiation and their application | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
アクセス権 | ||||||
アクセス権 | metadata only access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
著者 |
A. Vishnyakov, E.
× A. Vishnyakov, E.× O. Kolesnikov, A.× ピロジコフ, アレキサンダー× N. Ragozin, E.× N. Shatokhin, A.× Pirozhkov, Alexander |
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抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | We briefly review the works concerned with the development and experimental use of the spectral instruments based on aperiodic reflection gratings whose spacing varies monotonically across the aperture according to a prescribed law (VLS gratings). The review considers the employment of VLS-grating instruments intended for the spectroscopy of laboratory and astrophysical plasmas, including the diagnostics of relativistic laser plasmas, for measuring X-ray laser linewidths, for recording the high-order harmonics of laser radiation, the radiation of fast electric discharges and other laboratory X-ray sources, as well as in reflectometry, X-ray fluorescence analysis and microscopy with the use of synchrotron radiation and laser-plasma radiation, and in emission spectroscopy combined with an electron microscope. Also discussed are achievements in the recently undertaken design and development of special-purpose VLS spectrometers intended for the investigation of the electronic structure of different materials and molecules by the spectroscopic technique of resonant inelastic X-ray scattering of synchrotron radiation. We describe flat-field grazing-incidence spectrometers with concave VLS gratings, which are compatible with modern CCD detectors, as well as plane VLS gratings, which are the key elements of scanning high- and ultrahigh-resolution spectrometers/monochromators with a constant deviation angle and stigmatic (imaging) spectrometers, which are also compatible with CCD detectors. | |||||
書誌情報 |
Quantum Electronics 巻 48, 号 10, p. 916-929, 発行日 2018-08 |
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DOI | ||||||
識別子タイプ | DOI | |||||
関連識別子 | 10.1070/QEL16707 | |||||
関連サイト | ||||||
識別子タイプ | URI | |||||
関連識別子 | http://iopscience.iop.org/article/10.1070/QEL16707 |