@article{oai:repo.qst.go.jp:00049443,
 author = {A. Vishnyakov, E. and O. Kolesnikov, A. and ピロジコフ, アレキサンダー and N. Ragozin, E. and N. Shatokhin, A. and Pirozhkov, Alexander},
 issue = {10},
 journal = {Quantum Electronics},
 month = {Aug},
 note = {We briefly review the works concerned with the development and experimental use of the spectral instruments based on aperiodic reflection gratings whose spacing varies monotonically across the aperture according to a prescribed law (VLS gratings). The review considers the employment of VLS-grating instruments intended for the spectroscopy of laboratory and astrophysical plasmas, including the diagnostics of relativistic laser plasmas, for measuring X-ray laser linewidths, for recording the high-order harmonics of laser radiation, the radiation of fast electric discharges and other laboratory X-ray sources, as well as in reflectometry, X-ray fluorescence analysis and microscopy with the use of synchrotron radiation and laser-plasma radiation, and in emission spectroscopy combined with an electron microscope. Also discussed are achievements in the recently undertaken design and development of special-purpose VLS spectrometers intended for the investigation of the electronic structure of different materials and molecules by the spectroscopic technique of resonant inelastic X-ray scattering of synchrotron radiation. We describe flat-field grazing-incidence spectrometers with concave VLS gratings, which are compatible with modern CCD detectors, as well as plane VLS gratings, which are the key elements of scanning high- and ultrahigh-resolution spectrometers/monochromators with a constant deviation angle and stigmatic (imaging) spectrometers, which are also compatible with CCD detectors.},
 pages = {916--929},
 title = {Aperiodic reflection diffraction gratings for soft X-ray radiation and their application},
 volume = {48},
 year = {2018}
}