{"created":"2023-05-15T14:38:18.881324+00:00","id":49443,"links":{},"metadata":{"_buckets":{"deposit":"242f5c55-50f2-4f07-bdf3-5f4f794d3aa3"},"_deposit":{"created_by":1,"id":"49443","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"49443"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00049443","sets":["1"]},"author_link":["734711","734707","734710","734712","734708","734709"],"item_8_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2018-08","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"10","bibliographicPageEnd":"929","bibliographicPageStart":"916","bibliographicVolumeNumber":"48","bibliographic_titles":[{"bibliographic_title":"Quantum Electronics"}]}]},"item_8_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"We briefly review the works concerned with the development and experimental use of the spectral instruments based on aperiodic reflection gratings whose spacing varies monotonically across the aperture according to a prescribed law (VLS gratings). The review considers the employment of VLS-grating instruments intended for the spectroscopy of laboratory and astrophysical plasmas, including the diagnostics of relativistic laser plasmas, for measuring X-ray laser linewidths, for recording the high-order harmonics of laser radiation, the radiation of fast electric discharges and other laboratory X-ray sources, as well as in reflectometry, X-ray fluorescence analysis and microscopy with the use of synchrotron radiation and laser-plasma radiation, and in emission spectroscopy combined with an electron microscope. Also discussed are achievements in the recently undertaken design and development of special-purpose VLS spectrometers intended for the investigation of the electronic structure of different materials and molecules by the spectroscopic technique of resonant inelastic X-ray scattering of synchrotron radiation. We describe flat-field grazing-incidence spectrometers with concave VLS gratings, which are compatible with modern CCD detectors, as well as plane VLS gratings, which are the key elements of scanning high- and ultrahigh-resolution spectrometers/monochromators with a constant deviation angle and stigmatic (imaging) spectrometers, which are also compatible with CCD detectors.","subitem_description_type":"Abstract"}]},"item_8_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1070/QEL16707","subitem_relation_type_select":"DOI"}}]},"item_8_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://iopscience.iop.org/article/10.1070/QEL16707","subitem_relation_type_select":"URI"}}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"A. Vishnyakov, E."}],"nameIdentifiers":[{"nameIdentifier":"734707","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"O. Kolesnikov, A."}],"nameIdentifiers":[{"nameIdentifier":"734708","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"ピロジコフ, アレキサンダー"}],"nameIdentifiers":[{"nameIdentifier":"734709","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"N. Ragozin, E."}],"nameIdentifiers":[{"nameIdentifier":"734710","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"N. Shatokhin, A."}],"nameIdentifiers":[{"nameIdentifier":"734711","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Pirozhkov, Alexander","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"734712","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Aperiodic reflection diffraction gratings for soft X-ray radiation and their application","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Aperiodic reflection diffraction gratings for soft X-ray radiation and their application"}]},"item_type_id":"8","owner":"1","path":["1"],"pubdate":{"attribute_name":"公開日","attribute_value":"2018-12-19"},"publish_date":"2018-12-19","publish_status":"0","recid":"49443","relation_version_is_last":true,"title":["Aperiodic reflection diffraction gratings for soft X-ray radiation and their application"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-16T07:54:31.400745+00:00"}