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  1. 原著論文

Direct evaluation of influence of electron damage on the subcell performance in triple-junction solar cells using photoluminescence decays

https://repo.qst.go.jp/records/48477
https://repo.qst.go.jp/records/48477
c0674a8e-a9cf-48f3-a59a-283a9ebd35b8
Item type 学術雑誌論文 / Journal Article(1)
公開日 2018-02-07
タイトル
タイトル Direct evaluation of influence of electron damage on the subcell performance in triple-junction solar cells using photoluminescence decays
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_6501
資源タイプ journal article
アクセス権
アクセス権 metadata only access
アクセス権URI http://purl.org/coar/access_right/c_14cb
著者 M., Tex David

× M., Tex David

WEKO 487367

M., Tex David

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Nakamura, Tetsuya

× Nakamura, Tetsuya

WEKO 487368

Nakamura, Tetsuya

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Imaizumi, Mitsuru

× Imaizumi, Mitsuru

WEKO 487369

Imaizumi, Mitsuru

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Ohshima, Takeshi

× Ohshima, Takeshi

WEKO 487370

Ohshima, Takeshi

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Kanemitsu, Yoshihiko

× Kanemitsu, Yoshihiko

WEKO 487371

Kanemitsu, Yoshihiko

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大島 武

× 大島 武

WEKO 487372

en 大島 武

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抄録
内容記述タイプ Abstract
内容記述 The analysis of the subcell performance is crucial to understand the device physics and achieve optimized designs of triple junction solar cells which is a main stream of space solar cells now. Radiation-induced damage of inverted grown InGaP/GaAs/InGaAs triple-junction solar cells for various electron fluences are characterized using conventional current-voltage measurements and time-resolved photoluminescence. The conversion efficiencies of the entire device before and after damage are measured with current-voltage curves and compared with the efficiencies predicted from the time-resolved method. Using the time-resolved data, the change in the carrier dynamics in the subcells is discussed.
書誌情報 Scientific Reports

巻 7, p. 1985-1-1985-8, 発行日 2017-05
DOI
識別子タイプ DOI
関連識別子 10.1038/s41598-017-02141-0
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