{"created":"2023-05-15T14:37:34.791225+00:00","id":48477,"links":{},"metadata":{"_buckets":{"deposit":"61d13c73-34ec-4c12-be88-fb8a6d844094"},"_deposit":{"created_by":1,"id":"48477","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"48477"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00048477","sets":["1"]},"author_link":["487367","487371","487368","487370","487369","487372"],"item_8_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2017-05","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"1985-8","bibliographicPageStart":"1985-1","bibliographicVolumeNumber":"7","bibliographic_titles":[{"bibliographic_title":"Scientific Reports"}]}]},"item_8_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The analysis of the subcell performance is crucial to understand the device physics and achieve optimized designs of triple junction solar cells which is a main stream of space solar cells now. Radiation-induced damage of inverted grown InGaP/GaAs/InGaAs triple-junction solar cells for various electron fluences are characterized using conventional current-voltage measurements and time-resolved photoluminescence. The conversion efficiencies of the entire device before and after damage are measured with current-voltage curves and compared with the efficiencies predicted from the time-resolved method. Using the time-resolved data, the change in the carrier dynamics in the subcells is discussed.","subitem_description_type":"Abstract"}]},"item_8_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1038/s41598-017-02141-0","subitem_relation_type_select":"DOI"}}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"M., Tex David"}],"nameIdentifiers":[{"nameIdentifier":"487367","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Nakamura, Tetsuya"}],"nameIdentifiers":[{"nameIdentifier":"487368","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Imaizumi, Mitsuru"}],"nameIdentifiers":[{"nameIdentifier":"487369","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ohshima, Takeshi"}],"nameIdentifiers":[{"nameIdentifier":"487370","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kanemitsu, Yoshihiko"}],"nameIdentifiers":[{"nameIdentifier":"487371","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"大島 武","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"487372","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Direct evaluation of influence of electron damage on the subcell performance in triple-junction solar cells using photoluminescence decays","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Direct evaluation of influence of electron damage on the subcell performance in triple-junction solar cells using photoluminescence decays"}]},"item_type_id":"8","owner":"1","path":["1"],"pubdate":{"attribute_name":"公開日","attribute_value":"2018-02-07"},"publish_date":"2018-02-07","publish_status":"0","recid":"48477","relation_version_is_last":true,"title":["Direct evaluation of influence of electron damage on the subcell performance in triple-junction solar cells using photoluminescence decays"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T23:27:37.594995+00:00"}