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Ion-Beam-Induced Luminescence Analysis of β-SiAlON:Eu Scintillator under Focused Microbeam Irradiation
https://repo.qst.go.jp/records/47912
https://repo.qst.go.jp/records/47912f1a771ea-b818-4c58-947c-a947183779cc
| Item type | 学術雑誌論文 / Journal Article(1) | |||||
|---|---|---|---|---|---|---|
| 公開日 | 2017-01-12 | |||||
| タイトル | ||||||
| タイトル | Ion-Beam-Induced Luminescence Analysis of β-SiAlON:Eu Scintillator under Focused Microbeam Irradiation | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
| 資源タイプ | journal article | |||||
| アクセス権 | ||||||
| アクセス権 | metadata only access | |||||
| アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
| 著者 |
Kumar Parajuli, Raj
× Kumar Parajuli, Raj× Kada, Wataru× Kawabata, Shunsuke× Matsubara, Yoshinori× Sakai, Makoto× Miura, Kenta× Satoh, Takahiro× Koka, Masashi× Yamada, Naoto× Kamiya, Tomihiro× Hanaizumi, Osamu× Sato, Takahiro× Yamada, Naoto× Kamiya, Tomihiro |
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| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | The scintillation properties and radiation durability of β-SiAlON:Eu were evaluated under focused microbeam irradiation conditions using 3 MeV protons. In situ observation of scintillation from β-SiAlON:Eu was monitored using ion-beam-induced luminescence (IBIL) and compared with that from ZnS:Ag scintillators. A comparison of the spectra of IBIL from both scintillators shows that the intensity of IBIL was analogous at di erent peak wavelengths of 545 nm for β-SiAlON:Eu and 450 nm for ZnS:Ag under the same irradiation conditions. Better radiation hardness towards focused proton microbeam irradiation was observed for the β-SiAlON:Eu scintillator when continuous measurements by IBIL were used. A decay constant of approximately 1.11 × 1016, which is two orders of magnitude higher than that for ZnS:Ag, was obtained for the β-SiAlON:Eu scintillator for focused proton microbeam irradiation. IBIL was also capable of visualizing a previously damaged area of a ZnS:Ag scintillator, which corresponds to the focused beam scanning area of 100 × 100 μm2. Meanwhile, the irradiated region was not signi cantly distinguishable from the nonirradiated region on the β-SiAlON:Eu scintillator under the same beam uence. These results suggest that β-SiAlON:Eu could be an ideal candidate scintillator for convenient ionized particle beam monitoring and a diagnostic tool for focused and intense beam uence conditions up to 10^16 ions/cm2. | |||||
| 書誌情報 |
Sensors and Materials 巻 28, 号 8, p. 837-844, 発行日 2016-08 |
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| 出版者 | ||||||
| 出版者 | MYU K.K. | |||||
| DOI | ||||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | 10.18494/SAM.2016.1329 | |||||
