{"created":"2023-05-15T14:37:10.092267+00:00","id":47912,"links":{},"metadata":{"_buckets":{"deposit":"e5d972fe-8a2d-4439-b50d-f48c6b5fd10c"},"_deposit":{"created_by":1,"id":"47912","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"47912"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00047912","sets":["1"]},"author_link":["778206","778204","778214","778205","778213","778215","778211","778207","778202","778209","778203","778210","778208","778212"],"item_8_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2016-08","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"8","bibliographicPageEnd":"844","bibliographicPageStart":"837","bibliographicVolumeNumber":"28","bibliographic_titles":[{"bibliographic_title":"Sensors and Materials"}]}]},"item_8_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The scintillation properties and radiation durability of β-SiAlON:Eu were evaluated under focused microbeam irradiation conditions using 3 MeV protons. In situ observation of scintillation from β-SiAlON:Eu was monitored using ion-beam-induced luminescence (IBIL) and compared with that from ZnS:Ag scintillators. A comparison of the spectra of IBIL from both scintillators shows that the intensity of IBIL was analogous at di erent peak wavelengths of 545 nm for β-SiAlON:Eu and 450 nm for ZnS:Ag under the same irradiation conditions. Better radiation hardness towards focused proton microbeam irradiation was observed for the β-SiAlON:Eu scintillator when continuous measurements by IBIL were used. A decay constant of approximately 1.11 × 1016, which is two orders of magnitude higher than that for ZnS:Ag, was obtained for the β-SiAlON:Eu scintillator for focused proton microbeam irradiation. IBIL was also capable of visualizing a previously damaged area of a ZnS:Ag scintillator, which corresponds to the focused beam scanning area of 100 × 100 μm2. Meanwhile, the irradiated region was not signi cantly distinguishable from the nonirradiated region on the β-SiAlON:Eu scintillator under the same beam  uence. These results suggest that β-SiAlON:Eu could be an ideal candidate scintillator for convenient ionized particle beam monitoring and a diagnostic tool for focused and intense beam  uence conditions up to 10^16 ions/cm2.","subitem_description_type":"Abstract"}]},"item_8_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"MYU K.K."}]},"item_8_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"10.18494/SAM.2016.1329","subitem_relation_type_select":"DOI"}}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Kumar Parajuli, Raj"}],"nameIdentifiers":[{"nameIdentifier":"778202","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kada, Wataru"}],"nameIdentifiers":[{"nameIdentifier":"778203","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kawabata, Shunsuke"}],"nameIdentifiers":[{"nameIdentifier":"778204","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Matsubara, Yoshinori"}],"nameIdentifiers":[{"nameIdentifier":"778205","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sakai, Makoto"}],"nameIdentifiers":[{"nameIdentifier":"778206","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Miura, Kenta"}],"nameIdentifiers":[{"nameIdentifier":"778207","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Satoh, Takahiro"}],"nameIdentifiers":[{"nameIdentifier":"778208","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Koka, Masashi"}],"nameIdentifiers":[{"nameIdentifier":"778209","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Yamada, Naoto"}],"nameIdentifiers":[{"nameIdentifier":"778210","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kamiya, Tomihiro"}],"nameIdentifiers":[{"nameIdentifier":"778211","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hanaizumi, Osamu"}],"nameIdentifiers":[{"nameIdentifier":"778212","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sato, Takahiro","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"778213","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Yamada, Naoto","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"778214","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kamiya, Tomihiro","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"778215","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Ion-Beam-Induced Luminescence Analysis of β-SiAlON:Eu Scintillator under Focused Microbeam Irradiation","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Ion-Beam-Induced Luminescence Analysis of β-SiAlON:Eu Scintillator under Focused Microbeam Irradiation"}]},"item_type_id":"8","owner":"1","path":["1"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-01-12"},"publish_date":"2017-01-12","publish_status":"0","recid":"47912","relation_version_is_last":true,"title":["Ion-Beam-Induced Luminescence Analysis of β-SiAlON:Eu Scintillator under Focused Microbeam Irradiation"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-16T00:18:26.058785+00:00"}