@article{oai:repo.qst.go.jp:00047912,
 author = {Kumar Parajuli, Raj and Kada, Wataru and Kawabata, Shunsuke and Matsubara, Yoshinori and Sakai, Makoto and Miura, Kenta and Satoh, Takahiro and Koka, Masashi and Yamada, Naoto and Kamiya, Tomihiro and Hanaizumi, Osamu and Sato, Takahiro and Yamada, Naoto and Kamiya, Tomihiro},
 issue = {8},
 journal = {Sensors and Materials},
 month = {Aug},
 note = {The scintillation properties and radiation durability of β-SiAlON:Eu were evaluated under focused microbeam irradiation conditions using 3 MeV protons. In situ observation of scintillation from β-SiAlON:Eu was monitored using ion-beam-induced luminescence (IBIL) and compared with that from ZnS:Ag scintillators. A comparison of the spectra of IBIL from both scintillators shows that the intensity of IBIL was analogous at di erent peak wavelengths of 545 nm for β-SiAlON:Eu and 450 nm for ZnS:Ag under the same irradiation conditions. Better radiation hardness towards focused proton microbeam irradiation was observed for the β-SiAlON:Eu scintillator when continuous measurements by IBIL were used. A decay constant of approximately 1.11 × 1016, which is two orders of magnitude higher than that for ZnS:Ag, was obtained for the β-SiAlON:Eu scintillator for focused proton microbeam irradiation. IBIL was also capable of visualizing a previously damaged area of a ZnS:Ag scintillator, which corresponds to the focused beam scanning area of 100 × 100 μm2. Meanwhile, the irradiated region was not signi cantly distinguishable from the nonirradiated region on the β-SiAlON:Eu scintillator under the same beam  uence. These results suggest that β-SiAlON:Eu could be an ideal candidate scintillator for convenient ionized particle beam monitoring and a diagnostic tool for focused and intense beam  uence conditions up to 10^16 ions/cm2.},
 pages = {837--844},
 title = {Ion-Beam-Induced Luminescence Analysis of β-SiAlON:Eu Scintillator under Focused Microbeam Irradiation},
 volume = {28},
 year = {2016}
}