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Mo/Si Multilayer-Coated Photodiode Detector for Monitoring Soft X-Ray Laser Intensity
https://repo.qst.go.jp/records/54898
https://repo.qst.go.jp/records/54898c46a04ef-95cc-41c7-8cee-55e7e7f9fc44
Item type | 会議発表論文 / Conference Paper(1) | |||||
---|---|---|---|---|---|---|
公開日 | 2018-05-08 | |||||
タイトル | ||||||
タイトル | Mo/Si Multilayer-Coated Photodiode Detector for Monitoring Soft X-Ray Laser Intensity | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_5794 | |||||
資源タイプ | conference paper | |||||
アクセス権 | ||||||
アクセス権 | metadata only access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
著者 |
今園, 孝志
× 今園, 孝志× 今園 孝志 |
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抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | For the purpose of monitoring the intensity of laser-driven plasma soft X-ray laser (XRL) as well as providing an intense beam for XRL applications, the use of an X-ray photodiode detector coated with a Mo/Si multilayer mirror with high reflectance has been proposed and fabricated. The s-polarized reflectance of the multilayer-coated photodiode, MP, was measured to be 52.5% at an angle of incidence of 45° with synchrotron radiation at a wavelength of 13.9 nm. The transmittance of MP was 8.96%, which was defined as the ratio of the photodiode current measured at 45° to that at normal incidence. Moreover, with XRL pulses it is found that there is a strong correlation of 0.961 between the reflectance and transmittance of MP. These results indicate that the MP serves as a high reflectivity beam splitter with an X-ray detector enabling to be used for XRL applications. | |||||
書誌情報 |
Springer Proceedings in Physics 巻 202, p. 309-313, 発行日 2018-05 |
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出版者 | ||||||
出版者 | Springer International Publishing | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 0930-8989 | |||||
ISBN | ||||||
識別子タイプ | ISBN | |||||
関連識別子 | 978-3319-73024-0 | |||||
DOI | ||||||
識別子タイプ | DOI | |||||
関連識別子 | 10.1007/978-3-319-73025-7_46 |