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A Methodology for Reconstructing DSET Pulses from Heavy-Ion Broad-Beam Measurements
https://repo.qst.go.jp/records/79214
https://repo.qst.go.jp/records/79214c92b2a95-9754-4cf4-9c9b-7444a0521ae2
| Item type | 学術雑誌論文 / Journal Article(1) | |||||
|---|---|---|---|---|---|---|
| 公開日 | 2020-03-05 | |||||
| タイトル | ||||||
| タイトル | A Methodology for Reconstructing DSET Pulses from Heavy-Ion Broad-Beam Measurements | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
| 資源タイプ | journal article | |||||
| アクセス権 | ||||||
| アクセス権 | metadata only access | |||||
| アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
| 著者 |
Makino, Takahiro
× Makino, Takahiro× Onoda, Shinobu× Ohshima, Takeshi× Kobayashi, Daisuke× Ikeda, Hirokazu× Hirose, Kazuyuki× Takahiro, Makino× Shinobu, Onoda× Takeshi, Ohshima× Daisuke, Kobayashi× Kazuyuki, Hirose |
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| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | A table-based method for the estimation of heavy-ion-induced Digital Single Event Transient (DSET) voltage pulse-width in a single logic cell has been developed. The estimation method is based on the actual heavy-ion-induced transient current data in a single metal-oxide-semiconductor field effect transistor (MOSFET) used in the logic cell. The DSET pulse waveform in an inverter is obtained from which the pulse-width was estimated to be 420 ps. This DSET pulse-width value (420 ps) falls within the reasonable range of the DSET pulse-width distribution measured by the self-triggering flip-flop latch chain under heavy-ion irradiation test conditions. | |||||
| 書誌情報 |
Quantum Beam Science 巻 4, 号 1, p. 15, 発行日 2020-03 |
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| ISSN | ||||||
| 収録物識別子タイプ | ISSN | |||||
| 収録物識別子 | 2412-382X | |||||
| DOI | ||||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | 10.3390/qubs4010015 | |||||
| 関連サイト | ||||||
| 識別子タイプ | URI | |||||
| 関連識別子 | https://www.mdpi.com/2412-382X/4/1/15 | |||||
