@article{oai:repo.qst.go.jp:00079214,
 author = {Makino, Takahiro and Onoda, Shinobu and Ohshima, Takeshi and Kobayashi, Daisuke and Ikeda, Hirokazu and Hirose, Kazuyuki and Takahiro, Makino and Shinobu, Onoda and Takeshi, Ohshima and Daisuke, Kobayashi and Kazuyuki, Hirose},
 issue = {1},
 journal = {Quantum Beam Science},
 month = {Mar},
 note = {A table-based method for the estimation of heavy-ion-induced Digital Single Event Transient (DSET) voltage pulse-width in a single logic cell has been developed. The estimation method is based on the actual heavy-ion-induced transient current data in a single metal-oxide-semiconductor field effect transistor (MOSFET) used in the logic cell. The DSET pulse waveform in an inverter is obtained from which the pulse-width was estimated to be 420 ps. This DSET pulse-width value (420 ps) falls within the reasonable range of the DSET pulse-width distribution measured by the self-triggering flip-flop latch chain under heavy-ion irradiation test conditions.},
 title = {A Methodology for Reconstructing DSET Pulses from Heavy-Ion Broad-Beam Measurements},
 volume = {4},
 year = {2020}
}