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In Situ Synchrotron X-ray Diffraction Reciprocal Space Mapping Measurements in the RF-MBE Growth of GaInN on GaN and InN
https://repo.qst.go.jp/records/77782
https://repo.qst.go.jp/records/777824e6ad6a5-a92a-46cf-9af2-012a1753af12
Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2019-12-03 | |||||
タイトル | ||||||
タイトル | In Situ Synchrotron X-ray Diffraction Reciprocal Space Mapping Measurements in the RF-MBE Growth of GaInN on GaN and InN | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
アクセス権 | ||||||
アクセス権 | metadata only access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
著者 |
Yamaguchi, Tomohiro
× Yamaguchi, Tomohiro× Sasaki, Takuo× Fujikawa, Seiji× Takahashi, Masamitsu× Araki, Tsutomu× Onuma, Takeyoshi× Honda, Tohru× Nanishi, Yasushi× Takuo, Sasaki× Seiji, Fujikawa× Masamitsu, Takahashi |
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抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | In this work, in situ synchrotron X-ray diffraction reciprocal space mapping (RSM) measurements were carried out for the radio-frequency plasma-assisted molecular beam epitaxy (RF-MBE) growth of GaInN on GaN and InN layers, which were also grown by RF-MBE on commercialized GaN/c-sapphire templates. In situ XRD RSM measurements were performed using an MBE apparatus directly coupled to an X-ray diffractometer at the beamline of the synchrotron radiation facility SPring-8. It was observed in situ that both lattice relaxation and compositional pulling occurred during the initial growth stage, reducing the strain of GaInN on GaN and InN. Different initial growth behaviors of GaInN on GaN and InN were also observed from the results of the evolution of GaInN integrated peak intensities. | |||||
書誌情報 |
Crystals 巻 9, 号 12, p. 631-1, 発行日 2019-11 |
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出版者 | ||||||
出版者 | MDPI AG | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 2073-4352 | |||||
DOI | ||||||
識別子タイプ | DOI | |||||
関連識別子 | 10.3390/cryst9120631 | |||||
関連サイト | ||||||
識別子タイプ | URI | |||||
関連識別子 | https://www.mdpi.com/2073-4352/9/12/631 |