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  1. 原著論文

Proton radiation damage experiment for X-ray SOI pixel detectors

https://repo.qst.go.jp/records/77670
https://repo.qst.go.jp/records/77670
92832bb5-00f4-4d69-bfd5-465d4947ba38
Item type 学術雑誌論文 / Journal Article(1)
公開日 2019-11-28
タイトル
タイトル Proton radiation damage experiment for X-ray SOI pixel detectors
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_6501
資源タイプ journal article
アクセス権
アクセス権 metadata only access
アクセス権URI http://purl.org/coar/access_right/c_14cb
著者 Yarita, Keigo

× Yarita, Keigo

WEKO 1001927

Yarita, Keigo

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Kohmura, Takayoshi

× Kohmura, Takayoshi

WEKO 1001928

Kohmura, Takayoshi

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Hagino, Kouichi

× Hagino, Kouichi

WEKO 1001929

Hagino, Kouichi

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Kogiso, Taku

× Kogiso, Taku

WEKO 1001930

Kogiso, Taku

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Oono, Kenji

× Oono, Kenji

WEKO 1001931

Oono, Kenji

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Hamano, Tsuyoshi

× Hamano, Tsuyoshi

WEKO 1001932

Hamano, Tsuyoshi

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people, Others,many

× people, Others,many

WEKO 1001933

people, Others,many

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Tsuyoshi, Hamano

× Tsuyoshi, Hamano

WEKO 1001934

en Tsuyoshi, Hamano

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抄録
内容記述タイプ Abstract
内容記述 In low earth orbit, there are many cosmic rays composed primarily of high energy protons. These cosmicrays cause surface and bulk radiation effects, resulting in degradation of detector performance. Quantitativeevaluation of radiation hardness is essential in development of X-ray detectors for astronomical satellites. Weperformed proton irradiation experiments on newly developed X-ray detectors called XRPIX based on silicon-on-insulator technology at HIMAC in National Institute of Radiological Sciences. We irradiated 6 MeV protonswith a total dose of 0.5 krad, equivalent to 6 years irradiation in orbit. As a result, the gain increases by 0.2%and the energy resolution degrades by 0.5%. Finally we irradiated protons up to 20 krad and found that detectorperformance degraded significantly at 5 krad. With 5 krad irradiation corresponding to 60 years in orbit, thegain increases by 0.7% and the energy resolution worsens by 10%. By decomposing into noise components, wefound that the increase of the circuit noise is dominant in the degradation of the energy resolution.
書誌情報 Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

巻 924, p. 457-461, 発行日 2019-04
ISSN
収録物識別子タイプ ISSN
収録物識別子 0168-9002
DOI
識別子タイプ DOI
関連識別子 10.1016/j.nima.2018.09.057
関連サイト
識別子タイプ URI
関連識別子 https://www.sciencedirect.com/science/article/pii/S0168900218312014?via%3Dihub
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