@article{oai:repo.qst.go.jp:00077670,
 author = {Yarita, Keigo and Kohmura, Takayoshi and Hagino, Kouichi and Kogiso, Taku and Oono, Kenji and Hamano, Tsuyoshi and people, Others,many and Tsuyoshi, Hamano},
 journal = {Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment},
 month = {Apr},
 note = {In low earth orbit, there are many cosmic rays composed primarily of high energy protons. These cosmicrays cause surface and bulk radiation effects, resulting in degradation of detector performance. Quantitativeevaluation of radiation hardness is essential in development of X-ray detectors for astronomical satellites. Weperformed proton irradiation experiments on newly developed X-ray detectors called XRPIX based on silicon-on-insulator technology at HIMAC in National Institute of Radiological Sciences. We irradiated 6 MeV protonswith a total dose of 0.5 krad, equivalent to 6 years irradiation in orbit. As a result, the gain increases by 0.2%and the energy resolution degrades by 0.5%. Finally we irradiated protons up to 20 krad and found that detectorperformance degraded significantly at 5 krad. With 5 krad irradiation corresponding to 60 years in orbit, thegain increases by 0.7% and the energy resolution worsens by 10%. By decomposing into noise components, wefound that the increase of the circuit noise is dominant in the degradation of the energy resolution.},
 pages = {457--461},
 title = {Proton radiation damage experiment for X-ray SOI pixel detectors},
 volume = {924},
 year = {2019}
}