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  1. 研究・技術・調査報告

Study of the Lethal Effect Caused by the Various LET Particle Ion Beam in Budding Yeast S. cerevisiae

https://repo.qst.go.jp/records/74763
https://repo.qst.go.jp/records/74763
74521a7b-dca2-42c1-85eb-3aeca4181497
Item type 一般雑誌記事 / Article(1)
公開日 2019-03-17
タイトル
タイトル Study of the Lethal Effect Caused by the Various LET Particle Ion Beam in Budding Yeast S. cerevisiae
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_6501
資源タイプ article
アクセス権
アクセス権 metadata only access
アクセス権URI http://purl.org/coar/access_right/c_14cb
著者 Matuo, Y.

× Matuo, Y.

WEKO 737826

Matuo, Y.

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坂本, 綾子

× 坂本, 綾子

WEKO 737827

坂本, 綾子

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長谷, 純宏

× 長谷, 純宏

WEKO 737828

長谷, 純宏

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Shimizu, K.

× Shimizu, K.

WEKO 737829

Shimizu, K.

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Sakamoto, Ayako

× Sakamoto, Ayako

WEKO 737830

en Sakamoto, Ayako

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Hase, Yoshihiro

× Hase, Yoshihiro

WEKO 737831

en Hase, Yoshihiro

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内容記述タイプ Abstract
内容記述 To elucidate the mechanism of the mutation, we investigated the effects of high-LET carbon ion beams on lethality and then compared the results with those of carbon ion beams and neon ion beams obtained in our previous study. Cell survival decreased with an increase in the dose in each ion. At the same dose, the higher LET beam caused greater lethality. However, high-LET neon ions were not significantly more lethal than high-LET carbon ions. The lethality of LET on cells seems to reach a limit above a certain level. This tendency may be related to an overkill effect. In future, we will examine a mutagenesis effect by the various LET particle ion beams.
書誌情報 QST Takasaki Annual Report 2017

p. 102, 発行日 2019-03
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