@article{oai:repo.qst.go.jp:00074763,
 author = {Matuo, Y. and 坂本, 綾子 and 長谷, 純宏 and Shimizu, K. and Sakamoto, Ayako and Hase, Yoshihiro},
 journal = {QST Takasaki Annual Report 2017},
 month = {Mar},
 note = {To elucidate the mechanism of the mutation, we investigated the effects of high-LET carbon ion beams on lethality and then compared the results with those of carbon ion beams and neon ion beams obtained in our previous study. Cell survival decreased with an increase in the dose in each ion. At the same dose, the higher LET beam caused greater lethality. However, high-LET neon ions were not significantly more lethal than high-LET carbon ions. The lethality of LET on cells seems to reach a limit above a certain level. This tendency may be related to an overkill effect. In future, we will examine a mutagenesis effect by the various LET particle ion beams.},
 title = {Study of the Lethal Effect Caused by the Various LET Particle Ion Beam in Budding Yeast S. cerevisiae},
 year = {2019}
}