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Drastic decrease of carbonyl group following the loss of ether in PADC exposed to 222 nm UV photons

https://repo.qst.go.jp/records/66885
https://repo.qst.go.jp/records/66885
84fe42cb-f04e-4436-b80b-ac76e2e81534
Item type 会議発表用資料 / Presentation(1)
公開日 2018-09-03
タイトル
タイトル Drastic decrease of carbonyl group following the loss of ether in PADC exposed to 222 nm UV photons
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_c94f
資源タイプ conference object
アクセス権
アクセス権 metadata only access
アクセス権URI http://purl.org/coar/access_right/c_14cb
著者 Kusutomo, Tamon

× Kusutomo, Tamon

WEKO 657628

Kusutomo, Tamon

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Mori, Yutaka

× Mori, Yutaka

WEKO 657629

Mori, Yutaka

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Kanasaki, Masato

× Kanasaki, Masato

WEKO 657630

Kanasaki, Masato

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Oda, Keiji

× Oda, Keiji

WEKO 657631

Oda, Keiji

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Kodaira, Satoshi

× Kodaira, Satoshi

WEKO 657632

Kodaira, Satoshi

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Barillon, Remi

× Barillon, Remi

WEKO 657633

Barillon, Remi

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Yamauchi, Tomoya

× Yamauchi, Tomoya

WEKO 657634

Yamauchi, Tomoya

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楠本 多聞

× 楠本 多聞

WEKO 657635

en 楠本 多聞

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小平 聡

× 小平 聡

WEKO 657636

en 小平 聡

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抄録
内容記述タイプ Abstract
内容記述 Poly(allyl diglycol carbonate), PADC, has been recognized as the most sensitive Etched Track Detector, ETD,. A series of FT-IR spectrometric studies has been carried out to understand the latent track structure in exposed to gamma ray, X-ray, 28 MeV electron, proton and heavy ions. Based on these experiments, we found that the number of electrons which passed through a certain repeat unit of PADC is the most important parameter to express the detection threshold of etch pit formation [1].
In the present study, irradiation effects of UV photon with a wave length of 222 nm are examined [2]. The number density of ether decreases with increasing the photon fluence while that of carbonyl decrease above a critical fluence of 3.0×1019 photons/cm2 (Figure 1). The decarboxylation with releasing CO or CO2 gasses is also observed. The spatial distribution of UV defects are discussed using conventional track overlapping model to elucidate the two steps damage formation process [3]. The result expresses that continuous damages are never expected during photon exposures.
References:
[1] T. Kusumoto et al., JPS. Conf. Proc. 11, 010001 (2016).
[2] A. Sakamoto et al., Review of Graduate School of Maritime Sciences, 7, 87 (2010).
[3] T. Yamauchi, Raidat. Meas. 36, 73 (2003).
会議概要(会議名, 開催地, 会期, 主催者等)
内容記述タイプ Other
内容記述 The Ionizing Radiation and Polymers symposium (IRAP2018)
発表年月日
日付 2018-08-29
日付タイプ Issued
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