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Development of CdTe pixel detectors combined with an aluminum Schottky diode sensor and photon-counting ASICs
https://repo.qst.go.jp/records/54794
https://repo.qst.go.jp/records/54794c7284d7c-c4f2-470d-a8c4-7d25029ee4b6
Item type | 会議発表論文 / Conference Paper(1) | |||||
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公開日 | 2017-07-12 | |||||
タイトル | ||||||
タイトル | Development of CdTe pixel detectors combined with an aluminum Schottky diode sensor and photon-counting ASICs | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_5794 | |||||
資源タイプ | conference paper | |||||
アクセス権 | ||||||
アクセス権 | metadata only access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
著者 |
Toyokawa, H.
× Toyokawa, H.× Saji, C.× Kawase, M.× Wu, S.× Furukawa, Y.× Kajiwara, K.× Sato, M.× Hirano, T.× Shiro, A.× Shobu, T.× Suenaga, A.× Ikeda, H.× 城 鮎美× 菖蒲 敬久 |
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抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | We have been developing CdTe pixel detectors combined with a Schottky diode sensor and photon-counting ASICs. The hybrid pixel detector was designed with a pixel size of 200"μm by 200 μm and an area of 19 mm by 20 mm or 38.2 mm by 40.2 mm. The photon-counting ASIC, SP8-04F10K, has a preamplifier, a shaper, 3-level window-type discriminators and a 24-bits counter in each pixel. The single-chip detector with 100 by 95 pixels successfully operated with a photoncounting mode selectingX-ray energy with the windowcomparator and stable operationwas realized at 20 degrees C. We have performed a feasibility study for a white X-ray microbeam experiment. Laue diffraction patterns were measured during the scan of the irradiated position in a silicon steel sample. The grain boundaries were identified by using the differentials between adjacent images at each position. | |||||
書誌情報 |
Journal of Instrumentation 巻 12, 発行日 2017-01 |
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DOI | ||||||
識別子タイプ | DOI | |||||
関連識別子 | 10.1088/1748-0221/12/01/C01044 |