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Proposal for Experiment Systems Using Laser-Driven Heavy Ions and XFELs to Understand Physical Phenomena Occurring near the Incident Ion Path
https://repo.qst.go.jp/records/48977
https://repo.qst.go.jp/records/4897783bbd8dc-c9a1-40a3-9d0f-5e5a94d7adc3
| Item type | 学術雑誌論文 / Journal Article(1) | |||||
|---|---|---|---|---|---|---|
| 公開日 | 2018-05-11 | |||||
| タイトル | ||||||
| タイトル | Proposal for Experiment Systems Using Laser-Driven Heavy Ions and XFELs to Understand Physical Phenomena Occurring near the Incident Ion Path | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
| 資源タイプ | journal article | |||||
| アクセス権 | ||||||
| アクセス権 | metadata only access | |||||
| アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
| 著者 |
森林, 健悟
× 森林, 健悟× 森林 健悟 |
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| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | Experiment systems using laser driven heavy ions and X-ray free electron lasers (XFELs) as pump and probe sources, respectively, are proposed to investigate DNA damage that occur near the laser driven heavy ion path. This system is expected to provide high spatial and short time resolution measurements. | |||||
| 書誌情報 |
Proceedings of the 15th International Conference on X-ray 巻 202, p. 121-123, 発行日 2018-03 |
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| 出版者 | ||||||
| 出版者 | Springer | |||||
| ISSN | ||||||
| 収録物識別子タイプ | ISSN | |||||
| 収録物識別子 | 0930-8989 | |||||
| DOI | ||||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | 10.1007/978-3-319-73025-7_19 | |||||
| 関連サイト | ||||||
| 識別子タイプ | URI | |||||
| 関連識別子 | https://link.springer.com/chapter/10.1007/3-319-73025-7_19 | |||||
| 関連名称 | https://link.springer.com/chapter/10.1007/3-319-73025-7_19 | |||||
