{"created":"2023-05-15T14:37:58.153860+00:00","id":48977,"links":{},"metadata":{"_buckets":{"deposit":"2cbf314e-5c08-4a26-a14c-fc8882070fa9"},"_deposit":{"created_by":1,"id":"48977","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"48977"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00048977","sets":["1"]},"author_link":["493801","493800"],"item_8_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2018-03","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"123","bibliographicPageStart":"121","bibliographicVolumeNumber":"202","bibliographic_titles":[{"bibliographic_title":"Proceedings of the 15th International Conference on X-ray"}]}]},"item_8_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Experiment systems using laser driven heavy ions and X-ray free electron lasers (XFELs) as pump and probe sources, respectively, are proposed to investigate DNA damage that occur near the laser driven heavy ion path. This system is expected to provide high spatial and short time resolution measurements.","subitem_description_type":"Abstract"}]},"item_8_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Springer "}]},"item_8_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1007/978-3-319-73025-7_19","subitem_relation_type_select":"DOI"}}]},"item_8_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"https://link.springer.com/chapter/10.1007/3-319-73025-7_19"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://link.springer.com/chapter/10.1007/3-319-73025-7_19","subitem_relation_type_select":"URI"}}]},"item_8_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0930-8989","subitem_source_identifier_type":"ISSN"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"森林, 健悟"}],"nameIdentifiers":[{"nameIdentifier":"493800","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"森林 健悟","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"493801","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":" Proposal for Experiment Systems Using Laser-Driven Heavy Ions and XFELs to Understand Physical Phenomena Occurring near the Incident Ion Path ","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":" Proposal for Experiment Systems Using Laser-Driven Heavy Ions and XFELs to Understand Physical Phenomena Occurring near the Incident Ion Path "}]},"item_type_id":"8","owner":"1","path":["1"],"pubdate":{"attribute_name":"公開日","attribute_value":"2018-05-11"},"publish_date":"2018-05-11","publish_status":"0","recid":"48977","relation_version_is_last":true,"title":[" Proposal for Experiment Systems Using Laser-Driven Heavy Ions and XFELs to Understand Physical Phenomena Occurring near the Incident Ion Path "],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T23:22:17.935836+00:00"}