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In Situ Characterization of XFEL Beam Intensity Distribution and Focusability by High-Resolution LiF Crystal Detector
https://repo.qst.go.jp/records/48934
https://repo.qst.go.jp/records/48934f3963cd7-0e04-4475-88e0-7fb9af584860
| Item type | 学術雑誌論文 / Journal Article(1) | |||||
|---|---|---|---|---|---|---|
| 公開日 | 2018-05-08 | |||||
| タイトル | ||||||
| タイトル | In Situ Characterization of XFEL Beam Intensity Distribution and Focusability by High-Resolution LiF Crystal Detector | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
| 資源タイプ | journal article | |||||
| アクセス権 | ||||||
| アクセス権 | metadata only access | |||||
| アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
| 著者 |
A., Pikuz T.
× A., Pikuz T.× Ya., Faenov A.× Matsuoka, T.× Albertazzi, B.× Ozaki, N.× Hartely, N.× Muray, Ricardo Arturo O.× Yabuuchi, T.× Habara, H.× Matsuyama, S.× Yamauchi, K.× Inubushi, Y.× Togashi, T.× yumoto, H.× Tange, Y.× Tono, K.× Sato, Y.× Yabashi, M.× 錦野, 将元× 河内, 哲哉× Mitrofanov, A.× A., Pikuz S.× Bleiner, D.× Grum-Grzhimailo, A.× N., Rosanov N.× V., Vysotina N.× Harmand, M.× Koenig, M.× A., Tanaka K.× Ishikawa, T.× 錦野 将元× 河内 哲哉 |
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| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | We present here a new diagnostics based on using LiF crystal detectors that are able to perform measurements an intensity distribution of X-rays beams with diameters ranging from some microns up to some centimeters with high spatial resolution (~1 micron). in situ, 3D visualization of SACLA XFEL focused beam profile along propagation, including propagation inside photoluminescence solid materials, is demonstrated. | |||||
| 書誌情報 |
Proceedings of the 15th International Conference on X-Ray Lasers 巻 202, p. 109-116, 発行日 2018-05 |
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| ISSN | ||||||
| 収録物識別子タイプ | ISSN | |||||
| 収録物識別子 | 0930-8989 | |||||
| DOI | ||||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | 10.1007/978-3-319-73025-7_17 | |||||
