WEKO3
-
RootNode
アイテム
In Situ Characterization of XFEL Beam Intensity Distribution and Focusability by High-Resolution LiF Crystal Detector
https://repo.qst.go.jp/records/48934
https://repo.qst.go.jp/records/48934f3963cd7-0e04-4475-88e0-7fb9af584860
| Item type | 学術雑誌論文 / Journal Article(1) | |||||
|---|---|---|---|---|---|---|
| 公開日 | 2018-05-08 | |||||
| タイトル | ||||||
| タイトル | In Situ Characterization of XFEL Beam Intensity Distribution and Focusability by High-Resolution LiF Crystal Detector | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
| 資源タイプ | journal article | |||||
| アクセス権 | ||||||
| アクセス権 | metadata only access | |||||
| アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
| 著者 |
A., Pikuz T.
× A., Pikuz T.× Ya., Faenov A.× Matsuoka, T.× Albertazzi, B.× Ozaki, N.× Hartely, N.× Muray, Ricardo Arturo O.× Yabuuchi, T.× Habara, H.× Matsuyama, S.× Yamauchi, K.× Inubushi, Y.× Togashi, T.× yumoto, H.× Tange, Y.× Tono, K.× Sato, Y.× Yabashi, M.× 錦野, 将元× 河内, 哲哉× Mitrofanov, A.× A., Pikuz S.× Bleiner, D.× Grum-Grzhimailo, A.× N., Rosanov N.× V., Vysotina N.× Harmand, M.× Koenig, M.× A., Tanaka K.× Ishikawa, T.× 錦野 将元× 河内 哲哉 |
|||||
| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | We present here a new diagnostics based on using LiF crystal detectors that are able to perform measurements an intensity distribution of X-rays beams with diameters ranging from some microns up to some centimeters with high spatial resolution (~1 micron). in situ, 3D visualization of SACLA XFEL focused beam profile along propagation, including propagation inside photoluminescence solid materials, is demonstrated. | |||||
| 書誌情報 |
Proceedings of the 15th International Conference on X-Ray Lasers 巻 202, p. 109-116, 発行日 2018-05 |
|||||
| ISSN | ||||||
| 収録物識別子タイプ | ISSN | |||||
| 収録物識別子 | 0930-8989 | |||||
| DOI | ||||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | 10.1007/978-3-319-73025-7_17 | |||||
Share
Cite as
A., Pikuz T., Ya., Faenov A., Matsuoka, T., Albertazzi, B., Ozaki, N., Hartely, N., Muray, Ricardo Arturo O., Yabuuchi, T., Habara, H., Matsuyama, S., Yamauchi, K., Inubushi, Y., Togashi, T., yumoto, H., Tange, Y., Tono, K., Sato, Y., Yabashi, M., 錦野, 将元, 河内, 哲哉, Mitrofanov, A., A., Pikuz S., Bleiner, D., Grum-Grzhimailo, A., N., Rosanov N., V., Vysotina N., Harmand, M., Koenig, M., A., Tanaka K., Ishikawa, T., 錦野 将元, 河内 哲哉, n.d., In Situ Characterization of XFEL Beam Intensity Distribution and Focusability by High-Resolution LiF Crystal Detector: 109–116 p.
Loading...
