@article{oai:repo.qst.go.jp:00048934,
 author = {A., Pikuz T. and Ya., Faenov A. and Matsuoka, T. and Albertazzi, B. and Ozaki, N. and Hartely, N. and Muray, Ricardo Arturo O. and Yabuuchi, T. and Habara, H. and Matsuyama, S. and Yamauchi, K. and Inubushi, Y. and Togashi, T. and yumoto, H. and Tange, Y. and Tono, K. and Sato, Y. and Yabashi, M. and 錦野, 将元 and 河内, 哲哉 and Mitrofanov, A. and A., Pikuz S. and Bleiner, D. and Grum-Grzhimailo, A. and N., Rosanov N. and V., Vysotina N. and Harmand, M. and Koenig, M. and A., Tanaka K. and Ishikawa, T. and 錦野 将元 and 河内 哲哉},
 journal = {Proceedings of the 15th International Conference on X-Ray Lasers},
 month = {May},
 note = {We present here a new diagnostics based on using LiF crystal detectors that are able to perform measurements an intensity distribution of X-rays beams with diameters ranging from some microns up to some centimeters with high spatial resolution (~1 micron). in situ, 3D visualization of SACLA XFEL focused beam profile along propagation, including propagation inside photoluminescence solid materials, is demonstrated.},
 pages = {109--116},
 title = {In Situ Characterization of XFEL Beam Intensity Distribution and Focusability by High-Resolution LiF Crystal Detector},
 volume = {202},
 year = {2018}
}