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Multilayer-coated photodiode-based beam intensity monitor for polarization analysis of plasma soft X-ray laser
https://repo.qst.go.jp/records/48618
https://repo.qst.go.jp/records/48618b50bf7ad-bd3b-42c3-ac68-395ad1397aed
Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2018-03-22 | |||||
タイトル | ||||||
タイトル | Multilayer-coated photodiode-based beam intensity monitor for polarization analysis of plasma soft X-ray laser | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
アクセス権 | ||||||
アクセス権 | metadata only access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
著者 |
今園, 孝志
× 今園, 孝志× 今園 孝志 |
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抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | A Mo/Si multilayer-coated photodiode detector (MP) for beam-intensity monitoring was prototyped and characterized using synchrotron radiation and X-ray laser (XRL) sources, in order to perform polarization analysis of a laser-driven plasma soft XRL generated from nickel-like silver plasma. At a wavelength of 13.9 nm and an angle of incidence of 45°, the s-polarization reflectance is 0.525 and shows a strong positive correlation with the transmittance corresponding to the photodiode current generated by the MP. We succeeded in performing polarization analysis of XRL beams with a large shot-to-shot intensity variation using the MP. Thus, this MP enables shot-to-shot monitoring and delivery of high intensity beams for downstream XRL experiments. | |||||
書誌情報 |
Applied Optics 巻 56, 号 21, p. 5824-5829, 発行日 2017-07 |
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出版者 | ||||||
出版者 | The Optical Society of America | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 2155-3165 | |||||
DOI | ||||||
識別子タイプ | DOI | |||||
関連識別子 | 10.1364/AO.56.005824 | |||||
関連サイト | ||||||
識別子タイプ | URI | |||||
関連識別子 | https://www.osapublishing.org/ao/abstract.cfm?uri=ao-56-21-5824 | |||||
関連名称 | https://www.osapublishing.org/ao/abstract.cfm?uri=ao-56-21-5824 |