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  1. 原著論文

Single event effect characterization of the mixed-signal ASIC developed for CCD camera in space use

https://repo.qst.go.jp/records/46670
https://repo.qst.go.jp/records/46670
433cb5a5-001e-4186-8640-1f8a641fa441
Item type 学術雑誌論文 / Journal Article(1)
公開日 2013-12-12
タイトル
タイトル Single event effect characterization of the mixed-signal ASIC developed for CCD camera in space use
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_6501
資源タイプ journal article
アクセス権
アクセス権 metadata only access
アクセス権URI http://purl.org/coar/access_right/c_14cb
著者 Nakajima, Hiroshi

× Nakajima, Hiroshi

WEKO 465299

Nakajima, Hiroshi

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Fujikawa, Mari

× Fujikawa, Mari

WEKO 465300

Fujikawa, Mari

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Mori, Hideki

× Mori, Hideki

WEKO 465301

Mori, Hideki

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Kan, Hiroaki

× Kan, Hiroaki

WEKO 465302

Kan, Hiroaki

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Ueda, Shutaro

× Ueda, Shutaro

WEKO 465303

Ueda, Shutaro

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Kosugi, Hiroko

× Kosugi, Hiroko

WEKO 465304

Kosugi, Hiroko

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Anabuki, Naohisa

× Anabuki, Naohisa

WEKO 465305

Anabuki, Naohisa

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Hayashida, Kiyoshi

× Hayashida, Kiyoshi

WEKO 465306

Hayashida, Kiyoshi

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Tsunemi, Hiroshi

× Tsunemi, Hiroshi

WEKO 465307

Tsunemi, Hiroshi

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P., Doty John

× P., Doty John

WEKO 465308

P., Doty John

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Ikeda, Hirokazu

× Ikeda, Hirokazu

WEKO 465309

Ikeda, Hirokazu

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Kitamura, Hisashi

× Kitamura, Hisashi

WEKO 465310

Kitamura, Hisashi

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Uchihori, Yukio

× Uchihori, Yukio

WEKO 465311

Uchihori, Yukio

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中嶋 大

× 中嶋 大

WEKO 465312

en 中嶋 大

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藤川 真里

× 藤川 真里

WEKO 465313

en 藤川 真里

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森 秀樹

× 森 秀樹

WEKO 465314

en 森 秀樹

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菅 裕哲

× 菅 裕哲

WEKO 465315

en 菅 裕哲

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小杉 寛子

× 小杉 寛子

WEKO 465316

en 小杉 寛子

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穴吹 直久

× 穴吹 直久

WEKO 465317

en 穴吹 直久

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林田 清

× 林田 清

WEKO 465318

en 林田 清

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北村 尚

× 北村 尚

WEKO 465319

en 北村 尚

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内堀 幸夫

× 内堀 幸夫

WEKO 465320

en 内堀 幸夫

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抄録
内容記述タイプ Abstract
内容記述 We present the single event effect (SEE) tolerance of a mixed-signal application-specific integrated circuit (ASIC) developed for a charge-coupled device camera onboard a future X-ray astronomical mission. We adopted proton and heavy ion beams at HIMAC/NIRS in Japan. The particles with high linear energy transfer (LET) of 57.9 MeV cm2/mg is used to measure the single event latch-up (SEL) tolerance, which results in a sufficiently low cross-section of σ_{SEL} < 4.2x10^{-11} cm2/(Ion×ASIC). The single event upset (SEU) tolerance is estimated with various kinds of species with wide range of energy. Taking into account that a part of the protons creates recoiled heavy ions that have higher LET than that of the incident protons, we derived the probability of SEU event as a function of LET. Then the SEE event rate in a low-earth orbit is estimated considering a simulation result of LET spectrum. SEL rate is below once per 49 years, which satisfies the required latch-up tolerance. The upper limit of the SEU rate is derived to be 1.3×10−3 events/s. Although the SEU events cannot be distinguished from the signals of X-ray photons from astronomical objects, the derived SEU rate is below 1.3% of expected non-X-ray background rate of the detector and hence these events should not be a major component of the instrumental background
書誌情報 Nuclear Instruments & Methods in Physics Research Section A

巻 731, p. 166-171, 発行日 2013-11
出版者
出版者 Elsevier
ISSN
収録物識別子タイプ ISSN
収録物識別子 0168-9002
DOI
識別子タイプ DOI
関連識別子 10.1016/j.nima.2013.05.146
関連サイト
識別子タイプ URI
関連識別子 http://www.sciencedirect.com/science/article/pii/S0168900213007572#
関連名称 http://www.sciencedirect.com/science/article/pii/S0168900213007572#
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