@article{oai:repo.qst.go.jp:00046670,
 author = {Nakajima, Hiroshi and Fujikawa, Mari and Mori, Hideki and Kan, Hiroaki and Ueda, Shutaro and Kosugi, Hiroko and Anabuki, Naohisa and Hayashida, Kiyoshi and Tsunemi, Hiroshi and P., Doty John and Ikeda, Hirokazu and Kitamura, Hisashi and Uchihori, Yukio and 中嶋 大 and 藤川 真里 and 森 秀樹 and 菅 裕哲 and 小杉 寛子 and 穴吹 直久 and 林田 清 and 北村 尚 and 内堀 幸夫},
 journal = {Nuclear Instruments & Methods in Physics Research Section A},
 month = {Nov},
 note = {We present the single event effect (SEE) tolerance of a mixed-signal application-specific integrated circuit (ASIC) developed for a charge-coupled device camera onboard a future X-ray astronomical mission. We adopted proton and heavy ion beams at HIMAC/NIRS in Japan. The particles with high linear energy transfer (LET) of 57.9 MeV cm2/mg is used to measure the single event latch-up (SEL) tolerance, which results in a sufficiently low cross-section of σ_{SEL} < 4.2x10^{-11} cm2/(Ion×ASIC). The single event upset (SEU) tolerance is estimated with various kinds of species with wide range of energy. Taking into account that a part of the protons creates recoiled heavy ions that have higher LET than that of the incident protons, we derived the probability of SEU event as a function of LET. Then the SEE event rate in a low-earth orbit is estimated considering a simulation result of LET spectrum. SEL rate is below once per 49 years, which satisfies the required latch-up tolerance. The upper limit of the SEU rate is derived to be 1.3×10−3 events/s. Although the SEU events cannot be distinguished from the signals of X-ray photons from astronomical objects, the derived SEU rate is below 1.3% of expected non-X-ray background rate of the detector and hence these events should not be a major component of the instrumental background},
 pages = {166--171},
 title = {Single event effect characterization of the mixed-signal ASIC developed for CCD camera in space use},
 volume = {731},
 year = {2013}
}