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  1. 原著論文

The scanning microbeam PIXE analysis facility at NIRS

https://repo.qst.go.jp/records/43311
https://repo.qst.go.jp/records/43311
1f69ca16-338c-49c8-98d6-ecc80c9eb160
Item type 学術雑誌論文 / Journal Article(1)
公開日 2003-12-24
タイトル
タイトル The scanning microbeam PIXE analysis facility at NIRS
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_6501
資源タイプ journal article
アクセス権
アクセス権 metadata only access
アクセス権URI http://purl.org/coar/access_right/c_14cb
著者 Imaseki, Hitoshi

× Imaseki, Hitoshi

WEKO 430824

Imaseki, Hitoshi

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Yukawa, Masae

× Yukawa, Masae

WEKO 430825

Yukawa, Masae

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Ishikawa, Takahiro

× Ishikawa, Takahiro

WEKO 430826

Ishikawa, Takahiro

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Iso, Hiroyuki

× Iso, Hiroyuki

WEKO 430827

Iso, Hiroyuki

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Hamano, Tsuyoshi

× Hamano, Tsuyoshi

WEKO 430828

Hamano, Tsuyoshi

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Matsumoto, Kenichi

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WEKO 430829

Matsumoto, Kenichi

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Yasuda, Nakahiro

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WEKO 430830

Yasuda, Nakahiro

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et.al

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WEKO 430831

et.al

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今関 等

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WEKO 430832

en 今関 等

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湯川 雅枝

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WEKO 430833

en 湯川 雅枝

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石川 剛弘

× 石川 剛弘

WEKO 430834

en 石川 剛弘

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濱野 毅

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WEKO 430835

en 濱野 毅

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松本 健一

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WEKO 430836

en 松本 健一

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安田 仲宏

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抄録
内容記述タイプ Abstract
内容記述 In March 1999, a HVEE Tandetron was installed in the Electrostatic Accelerator Building of NIRS (National Institute of Radiological Sciences) for PIXE (Particle Induced X-ray Emission) analysis. The specifications of the Tandetron accelerator system operating at NIRS are as follows: The accelerating voltage is 0.4 to 1.7MV, and the maximum beam current is 500nA at 3.4MeV. The accelerator facility incorporates three beam lines for conventional, in-air and microbeam PIXE analysis.
The scanning microbeam PIXE analysis line is based around an Oxford Microbeams OM2000 nuclear microscope end stage. This system provides the ability of multi-elemental mapping over sample areas up to 2 * 2 mm area with spatial resolutions routinely at 1 * 1 micrometres. The scheduled operation of this facility started in April 2000 and is controlled by the Division of Technical Service and Development. The result of beam resolution tests carried out in 2001 are as follows: For Scanning Transmission Ion Microscopy (STIM), the estimated beam size is 100 * 200 nm, measured using a 2.6 MeV proton beam scanned over a 12.7 micrometres repeat distance copper grid. For Particle Induced X-ray Analysis (PIXE) operation at 50 pA beam current the estimated best spot size is 0.4 * 0.6 micrometres. The micro beam facility is being used for research into the elemental distribution of small biological samples such as biological cells and tissue.
書誌情報 Nuclear Instruments & Methods in Physics Research Section B

巻 210, p. 42-47, 発行日 2003
ISSN
収録物識別子タイプ ISSN
収録物識別子 0168-583X
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