@article{oai:repo.qst.go.jp:00043311,
 author = {Imaseki, Hitoshi and Yukawa, Masae and Ishikawa, Takahiro and Iso, Hiroyuki and Hamano, Tsuyoshi and Matsumoto, Kenichi and Yasuda, Nakahiro and et.al and 今関 等 and 湯川 雅枝 and 石川 剛弘 and 濱野 毅 and 松本 健一 and 安田 仲宏},
 journal = {Nuclear Instruments & Methods in Physics Research Section B},
 month = {},
 note = {In March 1999, a HVEE Tandetron was installed in the Electrostatic Accelerator Building of NIRS (National Institute of Radiological Sciences) for PIXE (Particle Induced X-ray Emission) analysis. The specifications of the Tandetron accelerator system operating at NIRS are as follows: The accelerating voltage is 0.4 to 1.7MV, and the maximum beam current is 500nA at 3.4MeV. The accelerator facility incorporates three beam lines for conventional, in-air and microbeam PIXE analysis.
The scanning microbeam PIXE analysis line is based around an Oxford Microbeams OM2000 nuclear microscope end stage. This system provides the ability of multi-elemental mapping over sample areas up to 2 * 2 mm area with spatial resolutions routinely at 1 * 1 micrometres. The scheduled operation of this facility started in April 2000 and is controlled by the Division of Technical Service and Development. The result of beam resolution tests carried out in 2001 are as follows: For Scanning Transmission Ion Microscopy (STIM), the estimated beam size is 100 * 200 nm, measured using a 2.6 MeV proton beam scanned over a 12.7 micrometres repeat distance copper grid. For Particle Induced X-ray Analysis (PIXE) operation at 50 pA beam current the estimated best spot size is 0.4 * 0.6 micrometres. The micro beam facility is being used for research into the elemental distribution of small biological samples such as biological cells and tissue.},
 pages = {42--47},
 title = {The scanning microbeam PIXE analysis facility at NIRS},
 volume = {210},
 year = {2003}
}