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Development of non-destructive testing (NDT) technique for HIPed interface by Compton scattering X-ray spectroscopy
https://repo.qst.go.jp/records/85298
https://repo.qst.go.jp/records/8529822319cbd-0506-4553-aaba-046c6dde4281
Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2022-03-14 | |||||
タイトル | ||||||
タイトル | Development of non-destructive testing (NDT) technique for HIPed interface by Compton scattering X-ray spectroscopy | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
アクセス権 | ||||||
アクセス権 | metadata only access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
著者 |
Sakurai, Hiroshi
× Sakurai, Hiroshi× Suzuki, Kosuke× Ishii, Shoya× Hoshi, Kazushi× Nozawa, Takashi× Ozaki, Hidetsugu× Haga, Hiroto× Tanigawa, Hiroyasu× Someya, Yoji× Tsuchiya, Masao× Takeuchi, Hiroshi× Tsuji, Naruki× Takashi, Nozawa× Hiroyasu, Tanigawa× Yoji, Someya |
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抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | High energy X-rays (115.56 keV) were used to measure the HIPed interface of F82H steel. The X-ray energy spectra of the samples were analyzed focusing on W and Ta fluorescence X-rays, Compton scattering and elastic scattering X-rays. The results suggest the presence of SiOx and TaOx at the HIP interface and the accumulation of W near the HIP interface. These results indicate that high-energy X-ray spectrum analysis can be a non-destructive testing technique (NDT) to evaluate precipitates at the HIP interface of F82H steel. | |||||
書誌情報 |
Nuclear Materials and Energy 巻 31, p. 101171, 発行日 2022-03 |
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出版者 | ||||||
出版者 | ELSEVIER | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 2352179 | |||||
DOI | ||||||
識別子タイプ | DOI | |||||
関連識別子 | 10.1016/j.nme.2022.101171 |