{"created":"2023-05-15T15:02:57.637959+00:00","id":85298,"links":{},"metadata":{"_buckets":{"deposit":"51432d0a-be4e-4202-934b-3143823d5a29"},"_deposit":{"created_by":1,"id":"85298","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"85298"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00085298","sets":["1"]},"author_link":["1036438","1036432","1036433","1036428","1036431","1036437","1036434","1036436","1036440","1036426","1036439","1036435","1036429","1036430","1036427"],"item_8_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2022-03","bibliographicIssueDateType":"Issued"},"bibliographicPageStart":"101171","bibliographicVolumeNumber":"31","bibliographic_titles":[{"bibliographic_title":"Nuclear Materials and Energy"}]}]},"item_8_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"High energy X-rays (115.56 keV) were used to measure the HIPed interface of F82H steel. The X-ray energy spectra of the samples were analyzed focusing on W and Ta fluorescence X-rays, Compton scattering and elastic scattering X-rays. The results suggest the presence of SiOx and TaOx at the HIP interface and the accumulation of W near the HIP interface. These results indicate that high-energy X-ray spectrum analysis can be a non-destructive testing technique (NDT) to evaluate precipitates at the HIP interface of F82H steel.","subitem_description_type":"Abstract"}]},"item_8_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"ELSEVIER"}]},"item_8_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1016/j.nme.2022.101171","subitem_relation_type_select":"DOI"}}]},"item_8_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2352179","subitem_source_identifier_type":"ISSN"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Sakurai, Hiroshi"}],"nameIdentifiers":[{"nameIdentifier":"1036426","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Suzuki, Kosuke"}],"nameIdentifiers":[{"nameIdentifier":"1036427","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ishii, Shoya"}],"nameIdentifiers":[{"nameIdentifier":"1036428","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hoshi, Kazushi"}],"nameIdentifiers":[{"nameIdentifier":"1036429","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Nozawa, Takashi"}],"nameIdentifiers":[{"nameIdentifier":"1036430","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ozaki, Hidetsugu"}],"nameIdentifiers":[{"nameIdentifier":"1036431","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Haga, Hiroto"}],"nameIdentifiers":[{"nameIdentifier":"1036432","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Tanigawa, Hiroyasu"}],"nameIdentifiers":[{"nameIdentifier":"1036433","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Someya, Yoji"}],"nameIdentifiers":[{"nameIdentifier":"1036434","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Tsuchiya, Masao"}],"nameIdentifiers":[{"nameIdentifier":"1036435","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Takeuchi, Hiroshi"}],"nameIdentifiers":[{"nameIdentifier":"1036436","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Tsuji, Naruki"}],"nameIdentifiers":[{"nameIdentifier":"1036437","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Takashi, Nozawa","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1036438","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hiroyasu, Tanigawa","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1036439","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Yoji, Someya","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1036440","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Development of non-destructive testing (NDT) technique for HIPed interface by Compton scattering X-ray spectroscopy","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Development of non-destructive testing (NDT) technique for HIPed interface by Compton scattering X-ray spectroscopy"}]},"item_type_id":"8","owner":"1","path":["1"],"pubdate":{"attribute_name":"公開日","attribute_value":"2022-03-14"},"publish_date":"2022-03-14","publish_status":"0","recid":"85298","relation_version_is_last":true,"title":["Development of non-destructive testing (NDT) technique for HIPed interface by Compton scattering X-ray spectroscopy"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T17:31:55.195117+00:00"}