@article{oai:repo.qst.go.jp:00085298,
 author = {Sakurai, Hiroshi and Suzuki, Kosuke and Ishii, Shoya and Hoshi, Kazushi and Nozawa, Takashi and Ozaki, Hidetsugu and Haga, Hiroto and Tanigawa, Hiroyasu and Someya, Yoji and Tsuchiya, Masao and Takeuchi, Hiroshi and Tsuji, Naruki and Takashi, Nozawa and Hiroyasu, Tanigawa and Yoji, Someya},
 journal = {Nuclear Materials and Energy},
 month = {Mar},
 note = {High energy X-rays (115.56 keV) were used to measure the HIPed interface of F82H steel. The X-ray energy spectra of the samples were analyzed focusing on W and Ta fluorescence X-rays, Compton scattering and elastic scattering X-rays. The results suggest the presence of SiOx and TaOx at the HIP interface and the accumulation of W near the HIP interface. These results indicate that high-energy X-ray spectrum analysis can be a non-destructive testing technique (NDT) to evaluate precipitates at the HIP interface of F82H steel.},
 title = {Development of non-destructive testing (NDT) technique for HIPed interface by Compton scattering X-ray spectroscopy},
 volume = {31},
 year = {2022}
}