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{"_buckets": {"deposit": "74c2ac33-b3a2-4148-8fbb-e0b0839cf760"}, "_deposit": {"created_by": 1, "id": "48618", "owners": [1], "pid": {"revision_id": 0, "type": "depid", "value": "48618"}, "status": "published"}, "_oai": {"id": "oai:repo.qst.go.jp:00048618", "sets": ["1"]}, "author_link": ["488918", "488917"], "item_8_biblio_info_7": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2017-07", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "21", "bibliographicPageEnd": "5829", "bibliographicPageStart": "5824", "bibliographicVolumeNumber": "56", "bibliographic_titles": [{"bibliographic_title": "Applied Optics"}]}]}, "item_8_description_5": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "A Mo/Si multilayer-coated photodiode detector (MP) for beam-intensity monitoring was prototyped and characterized using synchrotron radiation and X-ray laser (XRL) sources, in order to perform polarization analysis of a laser-driven plasma soft XRL generated from nickel-like silver plasma. At a wavelength of 13.9 nm and an angle of incidence of 45°, the s-polarization reflectance is 0.525 and shows a strong positive correlation with the transmittance corresponding to the photodiode current generated by the MP. We succeeded in performing polarization analysis of XRL beams with a large shot-to-shot intensity variation using the MP. Thus, this MP enables shot-to-shot monitoring and delivery of high intensity beams for downstream XRL experiments.", "subitem_description_type": "Abstract"}]}, "item_8_publisher_8": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "The Optical Society of America"}]}, "item_8_relation_14": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type_id": {"subitem_relation_type_id_text": "10.1364/AO.56.005824", "subitem_relation_type_select": "DOI"}}]}, "item_8_relation_17": {"attribute_name": "関連サイト", "attribute_value_mlt": [{"subitem_relation_name": [{"subitem_relation_name_text": "https://www.osapublishing.org/ao/abstract.cfm?uri=ao-56-21-5824"}], "subitem_relation_type_id": {"subitem_relation_type_id_text": "https://www.osapublishing.org/ao/abstract.cfm?uri=ao-56-21-5824", "subitem_relation_type_select": "URI"}}]}, "item_8_source_id_9": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "2155-3165", "subitem_source_identifier_type": "ISSN"}]}, "item_access_right": {"attribute_name": "アクセス権", "attribute_value_mlt": [{"subitem_access_right": "metadata only access", "subitem_access_right_uri": "http://purl.org/coar/access_right/c_14cb"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "今園, 孝志"}], "nameIdentifiers": [{"nameIdentifier": "488917", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "今園 孝志", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "488918", "nameIdentifierScheme": "WEKO"}]}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Multilayer-coated photodiode-based beam intensity monitor for polarization analysis of plasma soft X-ray laser", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Multilayer-coated photodiode-based beam intensity monitor for polarization analysis of plasma soft X-ray laser"}]}, "item_type_id": "8", "owner": "1", "path": ["1"], "permalink_uri": "https://repo.qst.go.jp/records/48618", "pubdate": {"attribute_name": "公開日", "attribute_value": "2018-03-22"}, "publish_date": "2018-03-22", "publish_status": "0", "recid": "48618", "relation": {}, "relation_version_is_last": true, "title": ["Multilayer-coated photodiode-based beam intensity monitor for polarization analysis of plasma soft X-ray laser"], "weko_shared_id": -1}
Multilayer-coated photodiode-based beam intensity monitor for polarization analysis of plasma soft X-ray laser
https://repo.qst.go.jp/records/48618
https://repo.qst.go.jp/records/48618b50bf7ad-bd3b-42c3-ac68-395ad1397aed
Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2018-03-22 | |||||
タイトル | ||||||
タイトル | Multilayer-coated photodiode-based beam intensity monitor for polarization analysis of plasma soft X-ray laser | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
アクセス権 | ||||||
アクセス権 | metadata only access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
著者 |
今園, 孝志
× 今園, 孝志× 今園 孝志 |
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抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | A Mo/Si multilayer-coated photodiode detector (MP) for beam-intensity monitoring was prototyped and characterized using synchrotron radiation and X-ray laser (XRL) sources, in order to perform polarization analysis of a laser-driven plasma soft XRL generated from nickel-like silver plasma. At a wavelength of 13.9 nm and an angle of incidence of 45°, the s-polarization reflectance is 0.525 and shows a strong positive correlation with the transmittance corresponding to the photodiode current generated by the MP. We succeeded in performing polarization analysis of XRL beams with a large shot-to-shot intensity variation using the MP. Thus, this MP enables shot-to-shot monitoring and delivery of high intensity beams for downstream XRL experiments. | |||||
書誌情報 |
Applied Optics 巻 56, 号 21, p. 5824-5829, 発行日 2017-07 |
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出版者 | ||||||
出版者 | The Optical Society of America | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 2155-3165 | |||||
DOI | ||||||
識別子タイプ | DOI | |||||
関連識別子 | 10.1364/AO.56.005824 | |||||
関連サイト | ||||||
識別子タイプ | URI | |||||
関連識別子 | https://www.osapublishing.org/ao/abstract.cfm?uri=ao-56-21-5824 | |||||
関連名称 | https://www.osapublishing.org/ao/abstract.cfm?uri=ao-56-21-5824 |