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Visualization of light-emitting diode lighting damage process in radiation environment by an in situ measurement
https://repo.qst.go.jp/records/86491
https://repo.qst.go.jp/records/864916f09e4cc-8be3-41a8-88a7-79905e2b46c0
| Item type | 学術雑誌論文 / Journal Article(1) | |||||
|---|---|---|---|---|---|---|
| 公開日 | 2021-12-17 | |||||
| タイトル | ||||||
| タイトル | Visualization of light-emitting diode lighting damage process in radiation environment by an in situ measurement | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
| 資源タイプ | journal article | |||||
| アクセス権 | ||||||
| アクセス権 | metadata only access | |||||
| アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
| 著者 |
Yuji, Hosaka
× Yuji, Hosaka× Nobuyuki, Nishimori× Itoga, Toshiro× Nakazawa, Shingo× Tanaka, Shinichiro× Seno, Toshio× Kondo, Chikara× Inagaki, Takahiro× Fukui, Toru× Watanabe, Takahiro× Tanaka, Hitoshi× Yuji, Hosaka× Nobuyuki, Nishimori |
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| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | We investigated the radiation damage process of commercially available light-emitting diode (LED) lightings in an X-ray radiation environment such as the electron storage ring SPring-8. It was found that metal-oxide-semiconductor field-effect transistors (MOSFETs) in the LED power supplies were damaged by X-ray irradiation by the total dose effect greater than several hundred Gy (air kerma). To visualize the whole damage process, we performed in situ measurement of the MOSFET under an irradiation from an X-ray tube. The result clearly showed a sudden increase of the off-state drain current accompanying with a sharp increase of MOSFET temperature as a function of radiation dose, which eventually caused the device failure. We supposed from the result a significant increase of device lifetime by switching off the LED power supply and experimentally verified it by observing the increase of lifetime by an order of magnitude or more under the same irradiation condition. The revealed X-ray radiation damage process is expected to provide useful tips for employing LED lightings in X-ray radiation environments. | |||||
| 書誌情報 |
Japanese Journal of Applied Physics 巻 61, 号 7, p. 076504, 発行日 2022-07 |
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| 出版者 | ||||||
| 出版者 | IOP Publishing | |||||
| ISSN | ||||||
| 収録物識別子タイプ | ISSN | |||||
| 収録物識別子 | 0021-4922 | |||||
| DOI | ||||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | 10.35848/1347-4065/ac7836 | |||||
| 関連サイト | ||||||
| 識別子タイプ | URI | |||||
| 関連識別子 | https://iopscience.iop.org/article/10.35848/1347-4065/ac7836 | |||||
