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  1. 原著論文

Structural analysis of high-energy implanted Ni atoms into Si(100) by X-ray absorption fine structure spectroscopy

https://repo.qst.go.jp/records/86438
https://repo.qst.go.jp/records/86438
8bb186d7-ab1d-44e4-9ac9-9b4735420cad
Item type 学術雑誌論文 / Journal Article(1)
公開日 2022-06-29
タイトル
タイトル Structural analysis of high-energy implanted Ni atoms into Si(100) by X-ray absorption fine structure spectroscopy
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_6501
資源タイプ journal article
アクセス権
アクセス権 metadata only access
アクセス権URI http://purl.org/coar/access_right/c_14cb
著者 Shiro, Entani

× Shiro, Entani

WEKO 1055581

Shiro, Entani

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Shinichiro, Sato

× Shinichiro, Sato

WEKO 1055582

Shinichiro, Sato

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Mitsunori, Honda

× Mitsunori, Honda

WEKO 1055583

Mitsunori, Honda

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Chihiro, Suzuki

× Chihiro, Suzuki

WEKO 1055584

Chihiro, Suzuki

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Tomitsugu, Taguchi

× Tomitsugu, Taguchi

WEKO 1055585

Tomitsugu, Taguchi

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Shunya, Yamamoto

× Shunya, Yamamoto

WEKO 1055586

Shunya, Yamamoto

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Takeshi, Ohshima

× Takeshi, Ohshima

WEKO 1055587

Takeshi, Ohshima

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Shiro, Entani

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WEKO 1055588

en Shiro, Entani

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Shinichiro, Sato

× Shinichiro, Sato

WEKO 1055589

en Shinichiro, Sato

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Chihiro, Suzuki

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WEKO 1055590

en Chihiro, Suzuki

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Tomitsugu, Taguchi

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WEKO 1055591

en Tomitsugu, Taguchi

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Shunya, Yamamoto

× Shunya, Yamamoto

WEKO 1055592

en Shunya, Yamamoto

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Takeshi, Ohshima

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WEKO 1055593

en Takeshi, Ohshima

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抄録
内容記述タイプ Abstract
内容記述 Ni silicide synthesis by Ni ion beam irradiation into Si attracts attention due to its advantages including the ability of formation of local structures, the controllability of ion beams, the formability of silicide without heat treatment and the high reproducibility of the resulting specimen. In this work, we investigate the local atomic structure of Si implanted with 3.0 MeV Ni^+ ions. Analysis of Ni K -edge fluorescent-yield extended X-ray absorption fine structure reveals that Ni atoms have mixed structure of metallic-like face-centered cubic Ni and NiSi_2 phases at the initial stage of the irradiation and the formation of NiSi_2 promotes significantly with the ion fluence above 10^15 ions・cm^-2 . With consideration of the agreement between the ion fluence threshold for the structural transition and the critical Si-amorphization fluence (7.1 × 10^14 ions・cm^-2 ), it is concluded that the amorphization of Si plays an important role in the synthesis of the NiSi_2 phase in Ni~+ -irradiated Si.
書誌情報 radiation physics and chemistry

号 199, p. 110369, 発行日 2022-07
DOI
識別子タイプ DOI
関連識別子 10.1016/j.radphyschem.2022.110369
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