WEKO3
アイテム
Intense emission of surface-derived secondary ions by shallower angle impacts of energetic MeV C60 ions
https://repo.qst.go.jp/records/85816
https://repo.qst.go.jp/records/85816fd9880df-3d6f-46fd-b306-bcdce28d5586
| Item type | 学術雑誌論文 / Journal Article(1) | |||||
|---|---|---|---|---|---|---|
| 公開日 | 2022-03-16 | |||||
| タイトル | ||||||
| タイトル | Intense emission of surface-derived secondary ions by shallower angle impacts of energetic MeV C60 ions | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
| 資源タイプ | journal article | |||||
| アクセス権 | ||||||
| アクセス権 | metadata only access | |||||
| アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
| 著者 |
平田, 浩一
× 平田, 浩一× 山田, 圭介× 千葉, 敦也× 平野, 貴美× 齋藤, 勇一× Koichi, Hirata× Keisuke, Yamada× Atsuya, Chiba× Yoshimi, Hirano× Yuuichi, Saito |
|||||
| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | Impacts of energetic C60 ions with energies of the order of MeV are excellent ionization methods for highly sensitive secondary ion (SI) mass spectrometry because they can provide SIs necessary for the identification of target materials in high emission yields with high reproducibility. As part of an investigation into their SI emission phenomena with the aim of controlling the mass-analyzed depth range, we measured and characterized the impact angle dependence of SI mass spectra for MeV C60 ion impacts, and found that shallower angle impacts of MeV C60 ions can provide surface-sensitive information through intense emission of surface-derived SIs. | |||||
| 書誌情報 |
Applied Physics Express 巻 15, p. 046001, 発行日 2022-03 |
|||||
| 出版者 | ||||||
| 出版者 | The Japan Society of Applied Physics | |||||
| ISSN | ||||||
| 収録物識別子タイプ | ISSN | |||||
| 収録物識別子 | 1882-0778 | |||||
| DOI | ||||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | 10.35848/1882-0786/ac5e65 | |||||
| 関連サイト | ||||||
| 識別子タイプ | URI | |||||
| 関連識別子 | https://iopscience.iop.org/article/10.35848/1882-0786/ac5e65 | |||||
