{"_buckets": {"deposit": "791e1b46-c9c6-45b4-a645-f398c61db533"}, "_deposit": {"created_by": 1, "id": "85310", "owners": [1], "pid": {"revision_id": 0, "type": "depid", "value": "85310"}, "status": "published"}, "_oai": {"id": "oai:repo.qst.go.jp:00085310", "sets": ["29"]}, "author_link": ["1028310", "1028316", "1028306", "1028319", "1028311", "1028304", "1028312", "1028320", "1028305", "1028315", "1028317", "1028318", "1028307", "1028309", "1028313", "1028308", "1028314"], "item_10005_date_7": {"attribute_name": "発表年月日", "attribute_value_mlt": [{"subitem_date_issued_datetime": "2021-09-12", "subitem_date_issued_type": "Issued"}]}, "item_10005_description_5": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "SiCデバイス中に作製したシリコン空孔量子センサーを用いて電流誘起磁場を直接測定した", "subitem_description_type": "Abstract"}]}, "item_10005_description_6": {"attribute_name": "会議概要（会議名, 開催地, 会期, 主催者等）", "attribute_value_mlt": [{"subitem_description": "応用物理学会秋季学術講演会", "subitem_description_type": "Other"}]}, "item_access_right": {"attribute_name": "アクセス権", "attribute_value_mlt": [{"subitem_access_right": "metadata only access", "subitem_access_right_uri": "http://purl.org/coar/access_right/c_14cb"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "山崎, 雄一"}], "nameIdentifiers": [{"nameIdentifier": "1028304", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "増山, 雄太"}], "nameIdentifiers": [{"nameIdentifier": "1028305", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "佐藤, 真一郎"}], "nameIdentifiers": [{"nameIdentifier": "1028306", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "牧野, 高紘"}], "nameIdentifiers": [{"nameIdentifier": "1028307", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "山田, 尚人"}], "nameIdentifiers": [{"nameIdentifier": "1028308", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "佐藤, 隆博"}], "nameIdentifiers": [{"nameIdentifier": "1028309", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "児島, 一聡"}], "nameIdentifiers": [{"nameIdentifier": "1028310", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "土田, 秀一"}], "nameIdentifiers": [{"nameIdentifier": "1028311", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "星乃, 紀博"}], "nameIdentifiers": [{"nameIdentifier": "1028312", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "大島, 武"}], "nameIdentifiers": [{"nameIdentifier": "1028313", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Yuichi, Yamazaki", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "1028314", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Yuta, Masuyama", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "1028315", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Shinichiro, Sato", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "1028316", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Takahiro, Makino", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "1028317", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Naoto, Yamada", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "1028318", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Takahiro, Satoh", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "1028319", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Takeshi, Ohshima", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "1028320", "nameIdentifierScheme": "WEKO"}]}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "jpn"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "conference object", "resourceuri": "http://purl.org/coar/resource_type/c_c94f"}]}, "item_title": "シリコン空孔量子センサーによるSiCデバイス内電流誘起磁場の測定", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "シリコン空孔量子センサーによるSiCデバイス内電流誘起磁場の測定"}]}, "item_type_id": "10005", "owner": "1", "path": ["29"], "permalink_uri": "https://repo.qst.go.jp/records/85310", "pubdate": {"attribute_name": "公開日", "attribute_value": "2022-03-16"}, "publish_date": "2022-03-16", "publish_status": "0", "recid": "85310", "relation": {}, "relation_version_is_last": true, "title": ["シリコン空孔量子センサーによるSiCデバイス内電流誘起磁場の測定"], "weko_shared_id": -1}