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  1. 原著論文

M-Center in Neutron-Irradiated 4H-SiC

https://repo.qst.go.jp/records/85245
https://repo.qst.go.jp/records/85245
436074cc-4685-4ab5-971e-08e78ca5afdf
Item type 学術雑誌論文 / Journal Article(1)
公開日 2022-03-15
タイトル
タイトル M-Center in Neutron-Irradiated 4H-SiC
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_6501
資源タイプ journal article
アクセス権
アクセス権 metadata only access
アクセス権URI http://purl.org/coar/access_right/c_14cb
著者 Capan, Ivana

× Capan, Ivana

WEKO 1039094

Capan, Ivana

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Brodar, Tomislav

× Brodar, Tomislav

WEKO 1039095

Brodar, Tomislav

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Takahiro, Makino

× Takahiro, Makino

WEKO 1039096

Takahiro, Makino

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Radulovic, Vladimir

× Radulovic, Vladimir

WEKO 1039097

Radulovic, Vladimir

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Snoj, Luka

× Snoj, Luka

WEKO 1039098

Snoj, Luka

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Takahiro, Makino

× Takahiro, Makino

WEKO 1039099

en Takahiro, Makino

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内容記述タイプ Abstract
内容記述 We report on the metastable defects introduced in the n-type 4H-SiC material by epithermal and fast neutron irradiation. The epithermal and fast neutron irradiation defects in 4H-SiC are much less explored compared to electron or proton irradiation-induced defects. In addition to the carbon vacancy (Vc), silicon vacancy (Vsi) and carbon antisite-carbon vacancy (CAV) complex, the neutron irradiation has introduced four deep-level defects, all arising from the metastable defect, the M-center. The metastable deep-level defects were investigated by deep level transient spectroscopy (DLTS), high-resolution Laplace DLTS (L-DLTS) and isothermal DLTS. The existence of the fourth deep-level defect, M4, recently observed in ion-implanted 4H-SiC, has been additionally confirmed in neutron-irradiated samples. The isothermal DLTS technique has been proven as a useful tool for studying the metastable defects.
書誌情報 Crystals

巻 11, 号 11, 発行日 2021-11
ISSN
収録物識別子タイプ ISSN
収録物識別子 2073-4352
DOI
識別子タイプ DOI
関連識別子 10.3390/cryst11111404
関連サイト
識別子タイプ URI
関連識別子 https://www.mdpi.com/2073-4352/11/11/1404
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