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Soft X-ray spectrometers based on aperiodic reflection gratings and their application
https://repo.qst.go.jp/records/81439
https://repo.qst.go.jp/records/81439d0b72f7f-71c9-4a37-a965-cf5ea5d2feda
| Item type | 学術雑誌論文 / Journal Article(1) | |||||
|---|---|---|---|---|---|---|
| 公開日 | 2020-12-25 | |||||
| タイトル | ||||||
| タイトル | Soft X-ray spectrometers based on aperiodic reflection gratings and their application | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
| 資源タイプ | journal article | |||||
| アクセス権 | ||||||
| アクセス権 | metadata only access | |||||
| アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
| 著者 |
N. Ragozin, E.
× N. Ragozin, E.× A. Vishnyakov, E.× O. Kolesnikov, A.× Pirozhkov, Alexander× N. Shatokhin, A.× Pirozhkov, Alexander |
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| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | This paper is concerned with the history, properties, development, application and prospects of soft X-ray (2 – 300 Å) VLS spectrometers, i.e. spectrometers with reflection diffraction gratings whose spacing varies monotonically across the aperture according to a prescribed law (the so-called Varied Line-Space (VLS) gratings). An important feature of grazing-incidence VLS spectrometers is that the spectrum is formed on a nearly flat surface perpendicular (or slightly inclined) to the diffracted beams, making them perfectly compatible with modern CCD detectors (backside-illuminated CCDs). VLS spectrometers are employed for the spectroscopy of laboratory and astrophysical plasmas, including the diagnostics of relativistic laser-produced plasmas, for measuring the linewidth of an X-ray laser, recording the high-order harmonics of laser radiation, the emission of fast electric discharges and other laboratory X-ray sources. Instruments with VLS gratings are employed to advantage in reflectometry/metrology, X-ray fluorescence analysis, and microscopy with the use of synchrotron, free-electron laser, and laser-produced plasma radiation, as well as in SXR emission spectroscopy combined with an electron microscope (SXES). Recent years have seen the active development of VLS spectrometers dedicated to the investigation of the electronic structure of different materials and molecules by resonant inelastic X-ray scattering (RIXS) spectroscopy with synchrotron radiation. Among recent trends is the development of VLS gratings with a multilayer reflective coating and extension of the operating spectral range towards "tender" X-rays (ℏω∼ 1.5...6 keV), some projects aiming to achieve a resolving power λ/δλ∼105 in the region ℏω∼ 1 keV. Keywords: soft X-ray radiation, aperiodic reflection diffraction grating (VLS grating), flat-field spectrometer, scanning spectrometer/monochromator, stigmatic (imaging) spectrometer. | |||||
| 書誌情報 |
Physics-Uspekhi 巻 64, 号 5, p. 495-514, 発行日 2020-12 |
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| ISSN | ||||||
| 収録物識別子タイプ | ISSN | |||||
| 収録物識別子 | 1063-7869 | |||||
| DOI | ||||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | 10.3367/UFNe.2020.06.038799 | |||||
| 関連サイト | ||||||
| 識別子タイプ | URI | |||||
| 関連識別子 | https://ufn.ru/en/articles/accepted/38800/ | |||||
