WEKO3
アイテム
High-resolution angle-resolved photoemission spectroscopy and microscopy
https://repo.qst.go.jp/records/81350
https://repo.qst.go.jp/records/81350566b1b5f-4442-4c6a-8436-f0e9cab5a742
| Item type | 学術雑誌論文 / Journal Article(1) | |||||
|---|---|---|---|---|---|---|
| 公開日 | 2020-12-18 | |||||
| タイトル | ||||||
| タイトル | High-resolution angle-resolved photoemission spectroscopy and microscopy | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
| 資源タイプ | journal article | |||||
| アクセス権 | ||||||
| アクセス権 | metadata only access | |||||
| アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
| 著者 |
Iwasawa, Hideaki
× Iwasawa, Hideaki× Hideaki, Iwasawa |
|||||
| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | This review outlines fundamental principles, instrumentation, and capabilities of angle-resolved photoemission spectroscopy (ARPES) and microscopy.We will present how high-resolution ARPES enables to investigate fine structures of electronic band dispersions, Fermi surfaces, gap structures, and many-body interactions, and how angle-resolved photoemission microscopy (spatially-resolved ARPES) utilizing micro/nano-focused light allows to extract spatially localized electronic information at small dimensions. This work is focused on specific results obtained by the author from strongly correlated copper and ruthenium oxides, to help readers to understand consistently how these techniques can provide essential electronic information of materials, which can, in principle, apply to a wide variety of systems. | |||||
| 書誌情報 |
Electronic Structure 巻 2, 号 4, p. 043001, 発行日 2020-12 |
|||||
| 出版者 | ||||||
| 出版者 | IOP Publishing | |||||
| ISSN | ||||||
| 収録物識別子タイプ | ISSN | |||||
| 収録物識別子 | 2516-1075 | |||||
| DOI | ||||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | 10.1088/2516-1075/abb379 | |||||
| 関連サイト | ||||||
| 識別子タイプ | URI | |||||
| 関連識別子 | https://iopscience.iop.org/article/10.1088/2516-1075/abb379 | |||||
