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  1. 原著論文

Wide-range tracking and LET-spectra of energetic light and heavy charged particles

https://repo.qst.go.jp/records/81226
https://repo.qst.go.jp/records/81226
c38b0331-cc37-4c73-a0d5-352b4d574de3
Item type 学術雑誌論文 / Journal Article(1)
公開日 2020-12-07
タイトル
タイトル Wide-range tracking and LET-spectra of energetic light and heavy charged particles
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_6501
資源タイプ journal article
アクセス権
アクセス権 metadata only access
アクセス権URI http://purl.org/coar/access_right/c_14cb
著者 Granja, Carlos

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WEKO 1070359

Granja, Carlos

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Oancea, Cristina

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WEKO 1070360

Oancea, Cristina

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Jakubek, Jan

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WEKO 1070361

Jakubek, Jan

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Marek, Lukas

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WEKO 1070362

Marek, Lukas

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Benton, Eric

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WEKO 1070363

Benton, Eric

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Kodaira, Satoshi

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WEKO 1070364

Kodaira, Satoshi

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Miller, Jack

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WEKO 1070365

Miller, Jack

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Rucinski, Antoni

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WEKO 1070366

Rucinski, Antoni

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Gajewski, Jan

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WEKO 1070367

Gajewski, Jan

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Stasica, Paulina

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WEKO 1070368

Stasica, Paulina

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Zach, Vaclav

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Zach, Vaclav

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Stursa, Jan

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WEKO 1070370

Stursa, Jan

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Chvatil, David

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WEKO 1070371

Chvatil, David

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Krist, Pavel

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Krist, Pavel

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Satoshi, Kodaira

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抄録
内容記述タイプ Abstract
内容記述 We developed a highly-selective technique to measure the energy loss and linear-energy-transfer (LET) spectra of energetic charged particles in high-resolution and over a large collection of particle-event types. Precise and wide-range spectral and tracking measurements were performed with a single semiconductor pixel detector. The quantum-counting sensitivity, high-granularity and per-pixel spectrometric response of the Timepix ASIC chip enable the detailed spectral-tracking registration of single charged particles across the detector semiconductor sensor. Both the deposited energy along the particle trajectory (energy loss) and the path length of the particle track across the semiconductor sensor are precisely measured for each particle. This allows for the determination of the particle LET in silicon in high accuracy and over a wide-range of energies, particle types and directions. The tracking and energy loss response together with the resolving power at the particle-event level make it possible to selectively provide LET distributions of the light and heavy charged particle components in mixed-radiation and omnidirectional fields. This technique applies to energetic (E > 10 MeV/u) charged particles generating tracks greater than the pixel size and incident at nonperpendicular direction (>20◦) to the sensor plane. The technique applies also to electrons of energy above few MeV as well as highly energetic and minimum-ionizing-particles (MIPs). We make use of existing and in part newly collected data at well-defined radiation fields with proton and light ion beam accelerators. Flexible measurements, ease of deployment and online response are possible by the use of compact readout electronics such as the miniaturized radiation camera MiniPix (size < 8 cm, weight < 50 g) operable by any PC. Results are given for protons and light ions (He, C) of selected energies above 10 MeV/u and directions (2π FoV). We include also electrons (20 MeV). Selective and detailed LET spectra are produced over a wide range (10−1 to 102 keV/μm) in silicon.
書誌情報 Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

巻 988, p. 164901, 発行日 2021-02
出版者
出版者 Elsevier
ISSN
収録物識別子タイプ ISSN
収録物識別子 0168-9002
DOI
識別子タイプ DOI
関連識別子 10.1016/j.nima.2020.164901
関連サイト
識別子タイプ DOI
関連識別子 https://doi.org/10.1016/j.nima.2020.164901
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