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DEVELOPMENT OF A LOW-ENERGY POSITRON DIFFRACTION APPARATUS WITH A THREE-LAYER DELAY-LINE ANODE DETECTOR
https://repo.qst.go.jp/records/81027
https://repo.qst.go.jp/records/81027242be07c-f81e-4719-a8e2-56475f285fb6
| Item type | 会議発表用資料 / Presentation(1) | |||||
|---|---|---|---|---|---|---|
| 公開日 | 2020-11-17 | |||||
| タイトル | ||||||
| タイトル | DEVELOPMENT OF A LOW-ENERGY POSITRON DIFFRACTION APPARATUS WITH A THREE-LAYER DELAY-LINE ANODE DETECTOR | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_c94f | |||||
| 資源タイプ | conference object | |||||
| アクセス権 | ||||||
| アクセス権 | metadata only access | |||||
| アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
| 著者 |
Wada, Ken
× Wada, Ken× Shirasawa, Tetsuroh× Mochizuki, Izumi× Maekawa, Masaki× Kawasuso, Atsuo× Hyodo, Toshio× Wada, Ken× Maekawa, Masaki× Kawasuso, Atsuo |
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| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | Low-energy electron diffraction (LEED) is a well-established technique for structural analysis of crystal surfaces. However, in the case of surfaces containing heavy elements, complex multiple scattering makes it difficult to analyze. Low-energy positron diffraction (LEPD), the positron version of LEED, has been predicted by theorists to be an ideal surface structure analysis method to solve the difficulties of LEED because it shows less-multiple scattering than LEED and simple scattering factors similar to those of X-ray diffraction [1]. We developed a LEPD experimental system using a high-intensity slow-positron beam generated by an electron linear accelerator (linac), and successfully observed LEPD pattern from Ge(001)-2×1 structure [2]. Due to the characteristics of the detector, however, the experimental efficiency is poor because of the existence of a cross-shaped dead area. To observe diffraction patterns without the cross-shaped dead area, we are developing “HEX-LEED/LEPD” system consisting of a set of a three-layer delay-line anode detector (also called a Hexanode from its appearance) and microchannel plates (MCPs) [3] with a center hole in collaboration with the developer of the detector (RoentDek) and the manufacturer of LEED equipment (OCI). We have successfully observed LEED patterns without the cross-shaped dead area by using the HEX-LEED/LEPD system developed. |
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| 会議概要（会議名, 開催地, 会期, 主催者等） | ||||||
| 内容記述タイプ | Other | |||||
| 内容記述 | 4th QST International Symposium -Innovation from Quantum Materials Science- | |||||
| 発表年月日 | ||||||
| 日付 | 2020-11-04 | |||||
| 日付タイプ | Issued | |||||
