WEKO3
アイテム
Micro-ion beam-induced luminescence spectroscopy for evaluating SiAlON scintillators
https://repo.qst.go.jp/records/80596
https://repo.qst.go.jp/records/80596acf69b97-0def-47ef-87b9-3059db26f322
| Item type | 学術雑誌論文 / Journal Article(1) | |||||
|---|---|---|---|---|---|---|
| 公開日 | 2020-09-30 | |||||
| タイトル | ||||||
| タイトル | Micro-ion beam-induced luminescence spectroscopy for evaluating SiAlON scintillators | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
| 資源タイプ | journal article | |||||
| アクセス権 | ||||||
| アクセス権 | metadata only access | |||||
| アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
| 著者 |
Kada, W.
× Kada, W.× Satoh, Takahiro× Yamada, S.× Koka, M.× Yamada, Naoto× Miura, K.× Hanaizumi, O.× Takahiro, Satoh× Naoto, Yamada |
|||||
| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | Ion beam-induced luminescence (IBIL) spectroscopy was used for luminescent material characterization and analysis for the investigation of new scintillator families. Under continuous 3 MeV proton microbeam irradiation, the crystal structures of α-SiAlON:Eu, β-SiAlON:Eu, and CaAlSiN3 (CASN) emitted bright luminescence at peak wavelengths of 605, 540, and 670 nm, respectively. As the irradiation progressed, the IBIL intensity of the conventional ZnS:Ag scintillator decreased sharply, whereas that of the SiAlONs and CASN remained within the detection limit. IBIL spectroscopy was performed on individual grains of the SiAlON scintillators. IBIL imaging and spectroscopy of two grains of β-SiAlON:Eu showed that the main peak in the IBIL spectrum of β-SiAlON:Eu obtained from a large-area beam scan consisted of several small peaks, which were observed in spectra from individual grains. Our experimental results suggest that microscopic spectroscopy of IBIL is an effective tool for microscopic material characterization of luminescent targets. | |||||
| 書誌情報 |
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 巻 477, p. 66-72, 発行日 2020-08 |
|||||
| ISSN | ||||||
| 収録物識別子タイプ | ISSN | |||||
| 収録物識別子 | 0168-583X | |||||
| DOI | ||||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | 10.1016/j.nimb.2019.10.001 | |||||
| 関連サイト | ||||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | https://doi.org/10.1016/j.nimb.2019.10.001 | |||||
