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  1. 原著論文

Development of a method for positron annihilation lifetime measurement in thin polyethylene films using a Na-22 source

https://repo.qst.go.jp/records/80496
https://repo.qst.go.jp/records/80496
d790ab48-3d33-4815-a889-ea01e9f5f98f
Item type 学術雑誌論文 / Journal Article(1)
公開日 2020-09-14
タイトル
タイトル Development of a method for positron annihilation lifetime measurement in thin polyethylene films using a Na-22 source
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_6501
資源タイプ journal article
アクセス権
アクセス権 metadata only access
アクセス権URI http://purl.org/coar/access_right/c_14cb
著者 Yamawaki, Masato

× Yamawaki, Masato

WEKO 1002314

Yamawaki, Masato

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Uesugi, Naoya

× Uesugi, Naoya

WEKO 1002315

Uesugi, Naoya

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Oka, Toshitaka

× Oka, Toshitaka

WEKO 1002316

Oka, Toshitaka

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Nagasawa, Naotsugu

× Nagasawa, Naotsugu

WEKO 1002317

Nagasawa, Naotsugu

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Ando, Hirokazu

× Ando, Hirokazu

WEKO 1002318

Ando, Hirokazu

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Brain, E. O' Rourke

× Brain, E. O' Rourke

WEKO 1002319

Brain, E. O' Rourke

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Kobayashi, Yoshinori

× Kobayashi, Yoshinori

WEKO 1002320

Kobayashi, Yoshinori

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Naotsugu, Nagasawa

× Naotsugu, Nagasawa

WEKO 1002321

en Naotsugu, Nagasawa

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抄録
内容記述タイプ Abstract
内容記述 Positron annihilation lifetime measurements were performed on polyethylene films [Low Density Polyethylene (LDPE) and Ultra High Molecular Weight Polyethylene (UHMWPE)] with thickness of 15 m – 2,000 m using a Na-22 positron source enclosed in a Kapton film. For thin films, some positrons will pass through the film and annihilate behind it. Using a single film in a commercial anti-coincidence system, by placing an annealed stainless steel (SUS304) cover behind the sample, it is possible to sufficiently measure the long lifetime ortho-positronium (o-Ps) component even in thin films. Additionally, calculated intensities of the o-Ps component determined from the estimated film transmittance agreed well with the measured values. Furthermore, by applying this method to uniaxially stretched UHMWPE, we were able to observe structural changes owing to the stretching consistent with shorter measured o-Ps lifetime and increased o-Ps intensity.
書誌情報 Japanese Journal of Applied Physics

巻 59, 号 11, p. 116504, 発行日 2020-11
出版者
出版者 IOP Publishing
ISSN
収録物識別子タイプ ISSN
収録物識別子 0021-4922
DOI
識別子タイプ DOI
関連識別子 10.35848/1347-4065/abc02e
関連サイト
識別子タイプ URI
関連識別子 https://iopscience.iop.org/article/10.35848/1347-4065/abc02e
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