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  1. 原著論文

Secondary ion mass spectrometry using energetic cluster ion beams: Toward highly sensitive imaging mass spectrometry

https://repo.qst.go.jp/records/80445
https://repo.qst.go.jp/records/80445
7c0d9079-4524-4b81-87bc-ddeaedf9366b
Item type 学術雑誌論文 / Journal Article(1)
公開日 2020-07-10
タイトル
タイトル Secondary ion mass spectrometry using energetic cluster ion beams: Toward highly sensitive imaging mass spectrometry
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_6501
資源タイプ journal article
アクセス権
アクセス権 metadata only access
アクセス権URI http://purl.org/coar/access_right/c_14cb
著者 平田, 浩一(産総研)

× 平田, 浩一(産総研)

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平田, 浩一(産総研)

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Yamada, Keisuke

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Yamada, Keisuke

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Chiba, Atsuya

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Chiba, Atsuya

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Hirano, Yoshimi

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Hirano, Yoshimi

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Saito, Yuuichi

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Saito, Yuuichi

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Yamada, Keisuke

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Chiba, Atsuya

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Hirano, Yoshimi

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Saito, Yuuichi

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内容記述タイプ Abstract
内容記述 Imaging mass spectrometry (IMS), based on linking mass-analysis data for ions and their original positions in a sample, allows the visualization of the spatial distribution of atomic and/or molecular species in the sample, and is therefore an essential analytical method for the characterization of chemical and biological materials. For sensitive elemental and chemical imaging using IMS, a sufficient amount of ions to be analyzed should be supplied from the analyzing area on the sample surface. Secodnary ion mass spectrometry (SIMS) using energetic cluster ions (ECIs) with energies of sub-MeV and above as primary ions (ECI-SIMS) can provide the secondary ions necessary for the characterization of organic materials with high emission yields. Hence, ECI-SIMS is a good method for highly sensitive IMS. We report recent progress in ECI beam manipulation techniques for applications of ECI-SIMS to highly sensitive IMS together with the characteristics of ECI impacts on organic materials.
書誌情報 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

巻 479, p. 240-245, 発行日 2020-09
出版者
出版者 Elsevier
ISSN
収録物識別子タイプ ISSN
収録物識別子 0168-583X
DOI
識別子タイプ DOI
関連識別子 10.1016/j.nimb.2020.06.027
関連サイト
識別子タイプ DOI
関連識別子 https://doi.org/10.1016/j.nimb.2020.06.027
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